| Literature DB >> 24027092 |
Christoph J Schaffer1, Claudia M Palumbiny, Martin A Niedermeier, Christian Jendrzejewski, Gonzalo Santoro, Stephan V Roth, Peter Müller-Buschbaum.
Abstract
In situ measurement of a polymer solar cell using micro grazing incidence small angle X-ray scattering (μGISAXS) and current-voltage tracking is demonstrated. While measuring electric characteristics under illumination, morphological changes are probed by μGISAXS. The X-ray beam (green) impinges on the photo active layer with a shallow angle and scatters on a 2d detector. Degradation is explained by the ongoing nanomorphological changes observed.Entities:
Keywords: bulk heterojunction; degradation; in situ grazing incidence small angle X-ray scattering (GISAXS); morphology; organic photovoltaics
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Year: 2013 PMID: 24027092 DOI: 10.1002/adma.201302854
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849