Literature DB >> 23940343

Direct atomic structure determination by the inspection of structural phase.

Philip N H Nakashima1, Alexander F Moodie, Joanne Etheridge.   

Abstract

A century has passed since Bragg solved the first atomic structure using diffraction. As with this first structure, all atomic structures to date have been deduced from the measurement of many diffracted intensities using iterative and statistical methods. We show that centrosymmetric atomic structures can be determined without the need to measure or even record a diffracted intensity. Instead, atomic structures can be determined directly and quickly from the observation of crystallographic phases in electron diffraction patterns. Furthermore, only a few phases are required to achieve high resolution. This represents a paradigm shift in structure determination methods, which we demonstrate with the moderately complex α-Al2O3. We show that the observation of just nine phases enables the location of all atoms with a resolution of better than 0.1 Å. This level of certainty previously required the measurement of thousands of diffracted intensities.

Entities:  

Keywords:  3-beam diffraction; CBED; convergent beam electron diffraction; crystallographic phase problem

Year:  2013        PMID: 23940343      PMCID: PMC3761622          DOI: 10.1073/pnas.1307323110

Source DB:  PubMed          Journal:  Proc Natl Acad Sci U S A        ISSN: 0027-8424            Impact factor:   11.205


  3 in total

1.  Accurate structure-factor phase determination by electron diffraction in noncentrosymmetric crystals.

Authors: 
Journal:  Phys Rev Lett       Date:  1989-01-30       Impact factor: 9.161

2.  Structural phase and amplitude measurement from distances in convergent-beam electron diffraction patterns.

Authors:  Philip N H Nakashima; Alexander F Moodie; Joanne Etheridge
Journal:  Acta Crystallogr A       Date:  2007-08-17       Impact factor: 2.290

3.  A practical guide to the measurement of structure phases and magnitudes by three-beam convergent beam electron diffraction.

Authors:  Philip N H Nakashima; Alexander F Moodie; Joanne Etheridge
Journal:  Ultramicroscopy       Date:  2008-03-18       Impact factor: 2.689

  3 in total
  1 in total

1.  Three-beam convergent-beam electron diffraction for measuring crystallographic phases.

Authors:  Yueming Guo; Philip N H Nakashima; Joanne Etheridge
Journal:  IUCrJ       Date:  2018-10-08       Impact factor: 4.769

  1 in total

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