| Literature DB >> 23938694 |
Qing Li1, Ali A Eftekhar, Majid Sodagar, Zhixuan Xia, Amir H Atabaki, Ali Adibi.
Abstract
We demonstrate a vertical integration of high-Q silicon nitride microresonators into the silicon-on-insulator platform for applications at the telecommunication wavelengths. Low-loss silicon nitride films with a thickness of 400 nm are successfully grown, enabling compact silicon nitride microresonators with ultra-high intrinsic Qs (~ 6 × 10(6) for 60 μm radius and ~ 2 × 10(7) for 240 μm radius). The coupling between the silicon nitride microresonator and the underneath silicon waveguide is based on evanescent coupling with silicon dioxide as buffer. Selective coupling to a desired radial mode of the silicon nitride microresonator is also achievable using a pulley coupling scheme. In this work, a 60-μm-radius silicon nitride microresonator has been successfully integrated into the silicon-on-insulator platform, showing a single-mode operation with an intrinsic Q of 2 × 10(6).Entities:
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Year: 2013 PMID: 23938694 DOI: 10.1364/OE.21.018236
Source DB: PubMed Journal: Opt Express ISSN: 1094-4087 Impact factor: 3.894