Literature DB >> 23925994

Fractional diffusion in silicon.

Eeuwe S Zijlstra1, Alan Kalitsov, Tobias Zier, Martin E Garcia.   

Abstract

Microscopic processes leading to ultrafast laser-induced melting of silicon are investigated by large-scale ab initio molecular dynamics simulations. Before becoming a liquid, the atoms are shown to be fractionally diffusive, which is a property that has so far been observed in crowded fluids consisting of large molecules. Here, it is found to occur in an elemental semiconductor.
© 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Entities:  

Keywords:  density functional theory; fractional diffusion; molecular dynamics simulations; semiconductors; ultrafast melting

Year:  2013        PMID: 23925994     DOI: 10.1002/adma201302559

Source DB:  PubMed          Journal:  Adv Mater        ISSN: 0935-9648            Impact factor:   30.849


  4 in total

1.  Quantum Hooke's law to classify pulse laser induced ultrafast melting.

Authors:  Hao Hu; Hepeng Ding; Feng Liu
Journal:  Sci Rep       Date:  2015-02-03       Impact factor: 4.379

2.  Subsurface diffusion in crystals and effect of surface permeability on the atomic step motion.

Authors:  Sergey Kosolobov
Journal:  Sci Rep       Date:  2019-09-17       Impact factor: 4.379

3.  Density functional tight binding approach utilized to study X-ray-induced transitions in solid materials.

Authors:  Vladimir Lipp; Victor Tkachenko; Michal Stransky; Bálint Aradi; Thomas Frauenheim; Beata Ziaja
Journal:  Sci Rep       Date:  2022-01-28       Impact factor: 4.379

4.  Signatures of nonthermal melting.

Authors:  Tobias Zier; Eeuwe S Zijlstra; Alan Kalitsov; Ioannis Theodonis; Martin E Garcia
Journal:  Struct Dyn       Date:  2015-08-18       Impact factor: 2.920

  4 in total

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