| Literature DB >> 23903096 |
Guohang Hu1, Yuanan Zhao, Xiaofeng Liu, Dawei Li, Qiling Xiao, Kui Yi, Jianda Shao.
Abstract
A reliable method, combining a wet etch process and real-time damage event imaging during a raster scan laser damage test, has been developed to directly determine the most dangerous precursor inducing low-density laser damage at 355 nm in fused silica. It is revealed that ~16% of laser damage sites were initiated at the place of the scratches, ~49% initiated at the digs, and ~35% initiated at invisible defects. The morphologies of dangerous scratches and digs were compared with those of moderate ones. It is found that local sharp variation at the edge, twist, or inside of a subsurface defect is the most dangerous laser damage precursor.Entities:
Year: 2013 PMID: 23903096 DOI: 10.1364/OL.38.002632
Source DB: PubMed Journal: Opt Lett ISSN: 0146-9592 Impact factor: 3.776