| Literature DB >> 23851620 |
Dion Khodagholy1, Jonathan Rivnay, Michele Sessolo, Moshe Gurfinkel, Pierre Leleux, Leslie H Jimison, Eleni Stavrinidou, Thierry Herve, Sébastien Sanaur, Róisín M Owens, George G Malliaras.
Abstract
The development of transistors with high gain is essential for applications ranging from switching elements and drivers to transducers for chemical and biological sensing. Organic transistors have become well-established based on their distinct advantages, including ease of fabrication, synthetic freedom for chemical functionalization, and the ability to take on unique form factors. These devices, however, are largely viewed as belonging to the low-end of the performance spectrum. Here we present organic electrochemical transistors with a transconductance in the mS range, outperforming transistors from both traditional and emerging semiconductors. The transconductance of these devices remains fairly constant from DC up to a frequency of the order of 1 kHz, a value determined by the process of ion transport between the electrolyte and the channel. These devices, which continue to work even after being crumpled, are predicted to be highly relevant as transducers in biosensing applications.Entities:
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Year: 2013 PMID: 23851620 PMCID: PMC3717497 DOI: 10.1038/ncomms3133
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Figure 1Active material and structure of the transistor.
(a) Chemical structure of PEDOT and PSS. A hole, indicated as a positive polaron on the PEDOT chain, is compensated by a sulphonate ion on the PSS chain. (b) Schematic of an OECT cross-section and the wiring diagram for device operation. (c) Optical micrograph of an individual transistor. Scale bar, 10 μm.
Figure 2Steady-state characteristics.
(a) Output characteristics for VG varying from 0 (top curve) to +0.5 V (bottom curve) with a step of +0.1 V. (b) Transfer curve for VD=−0.6 V, and the associated transconductance.
Comparison of the transconductance of various transistors.
| PEDOT:PSS (best) | NaCl | 10 | 10 | 0.2 | 0.6 | 4,020 | 402 | 6,700 |
| PEDOT:PSS (typical) | NaCl | 10 | 5 | 0.275 | 0.6 | 2,700 | 270 | 4,500 |
| Graphene | PBS+NaCl | 40 | 20 | 0.25 | 0.1 | 420 | 11 | 4,200 |
| Diamond | PBS+KCl ( | ~20 | ~5–20 | 0.22 | 0.2 | 18 | 0.9 | 90 |
| Silicon | SiO2/TiO2 ( | 20 | 20 | 0.25 | 0.25 | 15 | 0.75 | 60 |
| Silicon NW | SiO2, PBS | 20 | 2 | ~0.4 | 0.03 | 5 | 0.25 | 167 |
| ZnO | IL (DEME/TFSI) | 200 | 500 | 1.2 | 0.1 | 160 | 0.8 | 1,600 |
| ZnO NW | Solid electrolyte (PVA/LiClO4) | 0.018 | 0.94 | ~1.5 | 0.5 | 2.79 | 155 | 5.58 |
| Organic semiconductor: P3HT | IL (EMIM/TFSI) gel (PS-PEO-PS) | 100 | 20 | ~4 | 1 | 50 | 0.5 | 50 |
| ZnO | Al2O3 | 50 | 1 | 5.1 | 4 | 1,400 | 28 | 350 |
| Graphene | SiO2 (BG); Y2O3 (TG) | 2.7 | 0.31 | ~1.2 | 2 | 1,863 | 690 | 932 |
| III–V NW: n-InAs NW | SiN | 0.05 | 2 | 0.56 | 1 | 97.5 | 1,950 | 98 |
| III–V Bulk: GaN/InAlN | SiN | NR | 0.06 | 1.75 | 2 | NR | 1,105 | NR |
| Carbon nanotube (mat) | HfO2 | 10 | 1.5 | ~1 | 0.5 | 50 | 5 | 100 |
| Organic semiconductor: DNTT | AlO | 10 | 1 | ~2 | 2 | 12 | 1.2 | 95 |
| Silicon NW | SiO2 | 0.01 | 0.8–2 | ~2–4 | NR | 2 | 200 | NR |
Abbreviations: BG, bottom gate; NR, not reported; TG, top gate; NW, nanowire; PBS, phosphate buffered saline; SAM, self-assembled monolayer.
When BG/TG are both listed the device is operated in the dual gate configuration, and the applied gate voltage listed is the larger of the two. For this statement to hold, the changes described in the table regarding reference citations needs to be returned to the format of the as-submitted table.
*The GaN/InAlN device shown here shows the highest gm/W, but the paper does not report W, and therefore gm cannot be calculated. It should be noted that III–V bulk devices with channel widths of 10–100 μm can achieve g values of 30–50 mS3334.
Figure 3Frequency dependence of the transconductance.
The device was biased with VD=−0.6 V and VG=0.3 V, and an additional 100 mV peak-to-peak gate voltage oscillation was applied to measure the small-signal transconductance (open squares). The solid line shows the ionic charge injected in the channel.
Figure 4Resistance to mechanical deformation.
(a) An array of devices removed from the sacrificial glass substrate (active area shown as boxed region). (b) The array aggressively crumpled. (c) The array un-crumpled back to a flat sheet. Scale bar, 1 cm. (d) Output characteristics and (e) transfer characteristics for the same device as-prepared (black), after peeling (red) and after crumpling (blue). (f) Transconductance and time response for devices after peeling (red), and after crumpling (blue), normalized to the performance of each device as-prepared (Error bars represent standard deviation of normalized values for N=16 devices, on three different substrates).