Literature DB >> 23841516

The influence of chemical bonding configuration on atomic identification by force spectroscopy.

Joachim Welker1, Alfred John Weymouth, Franz J Giessibl.   

Abstract

The force between two atoms depends not only on their chemical species and distance, but also on the configuration of their chemical bonds to other atoms. This strongly affects atomic force spectroscopy, in which the force between the tip of an atomic force microscope and a sample is measured as a function of distance. We show that the short-range forces between tip and sample atoms depend strongly on the configuration of the tip, to the point of preventing atom identification with a poorly defined tip. Our solution is to control the tip apex before using it for spectroscopy. We demonstrate a method by which a CO molecule on Cu can be used to characterize the tip. In combination with gentle pokes, this can be used to engineer a specific tip apex. This CO Front atom Identification (COFI) method allows us to use a well-defined tip to conduct force spectroscopy.

Entities:  

Year:  2013        PMID: 23841516     DOI: 10.1021/nn403106v

Source DB:  PubMed          Journal:  ACS Nano        ISSN: 1936-0851            Impact factor:   15.881


  4 in total

1.  Quantifying the evolution of atomic interaction of a complex surface with a functionalized atomic force microscopy tip.

Authors:  Alexander Liebig; Prokop Hapala; Alfred J Weymouth; Franz J Giessibl
Journal:  Sci Rep       Date:  2020-08-24       Impact factor: 4.379

2.  Structural development and energy dissipation in simulated silicon apices.

Authors:  Samuel Paul Jarvis; Lev Kantorovich; Philip Moriarty
Journal:  Beilstein J Nanotechnol       Date:  2013-12-20       Impact factor: 3.649

3.  Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting.

Authors:  Hongqian Sang; Samuel P Jarvis; Zhichao Zhou; Peter Sharp; Philip Moriarty; Jianbo Wang; Yu Wang; Lev Kantorovich
Journal:  Sci Rep       Date:  2014-10-20       Impact factor: 4.379

4.  Robust procedure for creating and characterizing the atomic structure of scanning tunneling microscope tips.

Authors:  Sumit Tewari; Koen M Bastiaans; Milan P Allan; Jan M van Ruitenbeek
Journal:  Beilstein J Nanotechnol       Date:  2017-11-13       Impact factor: 3.649

  4 in total

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