| Literature DB >> 23805010 |
Jacek Gasiorowski1, Reghu Menon, Kurt Hingerl, Marko Dachev, Niyazi Serdar Sariciftci.
Abstract
The optical properties and electrical conductivity of highly conducting poly(3,4-ethylenedioxythiophene) (PEDOT) doped with poly(styrenesulfonate) (PSS) are reported as a function of the processing additive conditions. The addition of dimethyl sulfoxide (DMSO) increases the conductivity and modifies the dielectric response as observed from the ellipsometric studies. Also the surface roughness and morphology change with the composition of PEDOT:PSS:DMSO and film deposition conditions. The real part of the dielectric function becomes negative in highly conducting samples, indicating the presence of delocalized charge carriers. The real and imaginary parts of the refractive index were determined as a function of wavelength. The results are consistent with the increase in conductivity upon the addition of DMSO.Entities:
Keywords: Conducting polymers; Conductivity; Optical properties; Organic electronics; Spectroscopic ellipsometry; Surface morphology
Year: 2013 PMID: 23805010 PMCID: PMC3688308 DOI: 10.1016/j.tsf.2013.03.124
Source DB: PubMed Journal: Thin Solid Films ISSN: 0040-6090 Impact factor: 2.183
Fig. 1The PSS (red) is sparingly covered by short PEDOT segments (blue) creating spherical nanostructure. After adding DMSO the coil structure elongates into an ellipsoidal form.
The measured root mean square (RMS/nm) roughness and conductivity (σ/S cm− 1) values of the different PEDOT:PSS and PEDOT:PSS:DMSO layers.
| PEDOT:PSS composition | RMS roughness | σ/S cm− 1 | ||
|---|---|---|---|---|
| Pure PEDOT:PSS | A | 45 nm | 1.49 nm | 0.549 |
| B | 115 nm | 1.44 nm | 0.689 | |
| PEDOT:PSS:DMSO (5% v/v) | C | 50 nm | 1.64 nm | 454 |
| D | 120 nm | 1.94 nm | 563 | |
| PEDOT:PSS:DMSO (10% v/v) | E | 50 nm | 1.97 nm | 402 |
| F | 100 nm | 2.43 nm | 966 | |
| PEDOT:PSS:DMSO (15% v/v) | G | 40 nm | 1.87 nm | 531 |
| H | 120 nm | 2.32 nm | 866 | |
| PEDOT:PSS:DMSO (20% v/v) | I | 40 nm | 2.25 nm | 575 |
| J | 90 nm | 2.72 nm | 732 | |
Fig. 2AFM characterization of surface morphology of thin and thick film of PEDOT:PSS (A and B) and PEDOT:PSS mixed with 5% (C and D), 10% (E and F), 15% (G and H) and 20% (I and J) v/v DMSO.
Fig. 3Real part of the dielectric function of the pristine PEDOT:PSS (PH1000) (black) and PEDOT:PSS (PH1000) mixed with 10% (red) and 20% (blue) v/v DMSO.
Fig. 4The real (A) and imaginary (B) parts of the refractive index of the pristine PEDOT:PSS (PH1000) (black) and PEDOT:PSS (PH1000) mixed with 10% (red) and 20% (blue) v/v DMSO.
Fig. 5Absorption spectra evaluated from ellipsometric measurement of the pristine PEDOT:PSS (PH1000) (black) and PEDOT:PSS (PH1000) mixed with 10% (red) and 20% (blue) v/v DMSO.
Fig. 6Comparison of the real parts of dielectric function of PEDOT:PSS (PH1000) (black) and PEDOT:PSS (PH1000):DMSO (20% v/v) (red) with lower conducting PEDOT:PSS (PH510) (green) and PEDOT:PSS (PH510):DMSO (20% v/v) (blue).