| Literature DB >> 23705848 |
Chi-Hsin Huang1, Jian-Shiou Huang, Chih-Chung Lai, Hsin-Wei Huang, Su-Jien Lin, Yu-Lun Chueh.
Abstract
A bias polarity-manipulated transformation from filamentary to homogeneous resistive switching was demonstrated on a Pt/ZnO thin film/Pt device. Two types of switching behaviors, exhibiting different resistive switching characteristics and memory performances were investigated in detail. The detailed transformation mechanisms are systematically proposed. By controlling different compliance currents and RESET-stop voltages, controllable multistate resistances in low resistance states and a high resistance states in the ZnO thin film metal-insulator-metal structure under the homogeneous resistive switching were demonstrated. We believe that findings would open up opportunities to explore the resistive switching mechanisms and performance memristor with multistate storage.Entities:
Year: 2013 PMID: 23705848 DOI: 10.1021/am4007287
Source DB: PubMed Journal: ACS Appl Mater Interfaces ISSN: 1944-8244 Impact factor: 9.229