| Literature DB >> 23612304 |
D Kiefer1, M Yeung, T Dzelzainis, P S Foster, S G Rykovanov, C Ls Lewis, R S Marjoribanks, H Ruhl, D Habs, J Schreiber, M Zepf, B Dromey.
Abstract
Reflecting light from a mirror moving close to the speed of light has been envisioned as a route towards producing bright X-ray pulses since Einstein's seminal work on special relativity. For an ideal relativistic mirror, the peak power of the reflected radiation can substantially exceed that of the incident radiation due to the increase in photon energy and accompanying temporal compression. Here we demonstrate for the first time that dense relativistic electron mirrors can be created from the interaction of a high-intensity laser pulse with a freestanding, nanometre-scale thin foil. The mirror structures are shown to shift the frequency of a counter-propagating laser pulse coherently from the infrared to the extreme ultraviolet with an efficiency >10(4) times higher than in the case of incoherent scattering. Our results elucidate the reflection process of laser-generated electron mirrors and give clear guidance for future developments of a relativistic mirror structure.Entities:
Year: 2013 PMID: 23612304 PMCID: PMC3644103 DOI: 10.1038/ncomms2775
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Figure 1Reflection from relativistic electron mirrors.
(a) Electron density ne (in units of nc, logarithmic scale) showing the periodic emission of dense electron bunches at every half cycle of the driving laser field. (b) Frequency-filtered probe field intensity (filter: ω/ωL>5). The counter-propagating probe pulse (not shown here) reflects off the created relativistic electron mirrors, causing the periodic emission of intense, attosecond short radiation. (c) Lineout of the electron mirror γ-factor γ=(1−β2)−1/2 versus z (averaged in transverse dimension within ±1 μm around x=0 μm, logarithmic scale) superimposed with the normalized intensity lineout of the incident and reflected pulses. The mirror structure is sharply located in space, reflects off the probe pulse in the vacuum region behind the target and causes a frequency upshift governed by (1+β)2γ2ωL. (d) Reflectivity of the generated electron mirrors analysed for a backreflected wavelength of 80 nm (band width: 20%) as a function of the number of electrons involved in the reflection process, that is all electrons within the mirror structure with (1+β)2γ2=10 (band width: 20%). The reflectivity obtained from PIC simulation (dots) follows a quadratic scaling, as expected from coherent scattering theory (analytic curve). The best estimate of the experimentally observed reflectivity is 5 × 10−5 (green line), in fair agreement with the expected value. The estimate for the electron mirror reflectivity is discussed in detail in the Methods section. (e) Spectrum of the drive and probe field recorded behind the target normalized to the continuous background level. Dashed curve: spectrum (rescaled) of one isolated backscattered pulse.
Figure 2Experimental set-up.
The drive pulse (~5 J, 55 fs) is focused with an f/2 off-axis parabolic mirror to a focal spot of 3.5 μm full width at half maximum (FWHM) reaching peak intensities of 6 × 1020 W cm−2. Simultaneously, the probe pulse (~2 mJ, 55 fs) is shot from the opposite side quasi counter-propagating (angle between both beam axis ~1°), focused with a lens (f/50) to a 55 μm FWHM spot corresponding to a peak intensity of 1 × 1015 W cm−2. The radiation emitted from the foil is diagnosed at 0° with respect to target normal direction using a transmission grating spectrometer.
Figure 3Experimental spectra.
Quantitative comparison of the measured XUV spectra obtained from a 50- and 10-nm foil irradiated with (a,b) the drive pulse only and (c,d) drive and probe pulses synchronously. The backscattered XUV radiation reveals a periodically modulated spectrum when irradiating the nanometre foils with the counter-propagating pulse, whereas the signal without the probe is shot noise-dominated. In a–d dashed lines give the linear fit to the background. In c, error bars on the fit line are the maximal deviation of the background noise from the linear fit, whereas error bars at the spectral peaks are signal noise deduced from photon counting statistics. The spectra shown here are representative for a data set comprising 25 target shots, both in single- and dual-pulse configuration. No signal was observed when irradiating the foil with the probe pulse exclusively (not shown here). (e) Detector image (hot pixels removed) obtained from a 50-nm probe shot.