Literature DB >> 2357708

Pudenz antisiphon device tear as a cause of shunt malfunction.

R H Pudenz.   

Abstract

Mesh：

Year:  1990        PMID： 2357708     DOI： 10.1007/bf00308483

Source DB:  PubMed          Journal:  Childs Nerv Syst        ISSN： 0256-7040            Impact factor:   1.475


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  2 in total

1.  Pudenz antisiphon device tear as a cause of shunt malfunction.

Authors:  B Borowitz; E Ashkenazi; N Muallem; S Constantini
Journal:  Childs Nerv Syst       Date:  1989-10       Impact factor: 1.475

2.  Anti-siphon and reversible occlusion valves for shunting in hydrocephalus and preventing post-shunt subdural hematomas.

Authors:  H D Portnoy; R R Schulte; J L Fox; P D Croissant; L Tripp
Journal:  J Neurosurg       Date:  1973-06       Impact factor: 5.115
  2 in total

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