Literature DB >> 23477934

Fabrication of pores in a silicon carbide wafer by electrochemical etching with a glassy-carbon needle electrode.

Tomohiko Sugita1, Kazuki Hiramatsu, Shigeru Ikeda, Michio Matsumura.   

Abstract

An electrochemical method for making pores in a silicon carbide (SiC) wafer, in which a glassy-carbon (GC) needle electrode was used for processing, is described. By bringing the GC electrode into contact with SiC at its tip end in 20 mol dm(-3) HF solution and applying an anodic potential of or higher than 4 V vs Ag/AgCl to it, SiC was etched at the SiC/GC contact area, leading to pore formation in SiC. The diameter of the pore was almost the same as the diameter of the tip of the GC electrode (about 130 μm). By addition of sulfuric acid to the HF solution, the rate of pore formation was increased. As a result, the depth of pores formed after processing for 5 h at 10 V vs Ag/AgCl was increased from 15.3 μm to about 33 μm by addition of sulfuric acid at a concentration of 3.0 mol dm(-3).

Entities:  

Year:  2013        PMID: 23477934     DOI: 10.1021/am303167c

Source DB:  PubMed          Journal:  ACS Appl Mater Interfaces        ISSN: 1944-8244            Impact factor:   9.229


  1 in total

1.  Controlling the defects and transition layer in SiO2 films grown on 4H-SiC via direct plasma-assisted oxidation.

Authors:  Dae-Kyoung Kim; Kwang-Sik Jeong; Yu-Seon Kang; Hang-Kyu Kang; Sang W Cho; Sang-Ok Kim; Dongchan Suh; Sunjung Kim; Mann-Ho Cho
Journal:  Sci Rep       Date:  2016-10-10       Impact factor: 4.379

  1 in total

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