Literature DB >> 23476310

Sr-fresnoite determined from synchrotron X-ray powder diffraction data.

Anthony M T Bell1, C Michael B Henderson.   

Abstract

The fresnoite-type compound Sr2TiO(Si2O7), distrontium oxidotitanium disilicate, has been prepared by high-temperature solid-state synthesis. The results of a Rietveld refinement study, based on high-resolution synchrotron X-ray powder diffraction data, show that the title compound crystallizes in the space group P4bm and adopts the structure of other fresnoite-type mineral samples with general formula A2 TiO(Si2O7) (A = alkaline earth metal cation). The structure consists of titanosilicate layers composed of corner-sharing SiO4 tetra-hedra (forming Si2O7 disilicate units) and TiO5 square-based pyramids. These layers extend parallel to the ab plane and are stacked along the c axis. Layers of distorted SrO6 octa-hedra lie between the titanosilicate layers. The Sr(2+) ion, the SiO4 tetra-hedron and the bridging O atom of the disilicate unit are located on mirror planes whereas the TiO5 square-based pyramid is located on a fourfold rotation axis.

Entities:  

Year:  2012        PMID: 23476310      PMCID: PMC3588266          DOI: 10.1107/S1600536812048921

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For the crystal chemistry of fresnoites, see: Barbar & Roy (2012 ▶); Höche et al. (2002 ▶); ICDD (1989 ▶). For properties of Sr–fresnoites, see: Park & Navrotsky (2010 ▶). Atomic coordinates as starting parameters for the Rietveld refinement (Rietveld, 1969 ▶) of the present phases were taken from Ochi (2006 ▶); Goldschmidt & Thomassen (1923 ▶); Machida et al. (1982 ▶); Mitchell et al. (2000 ▶). For related strontium titanosilicates, see: Miyajima et al. (2002 ▶). For synchrotron data analysis, see: Hammersley (1997 ▶); Hammersley et al. (1996 ▶).

Experimental

Crystal data

Sr2TiSi2O8 M = 407.31 Tetragonal, a = 8.3200 (3) Å c = 5.0239 (2) Å V = 347.77 (2) Å3 Z = 2 Synchrotron radiation, λ = 0.207549 Å μ = 0.43 mm−1 T = 293 K Cylinder, 20 × 0.7 mm

Data collection

In-house design diffractometer Specimen mounting: capillary Data collection mode: transmission Scan method: continuous 2θmin = 0.053°, 2θmax = 11.915°, 2θstep = 0.008°

Refinement

R p = 0.052 R wp = 0.073 R exp = 0.031 R Bragg = 0.093 χ2 = 31.068 1476 data points 71 parameters 5 restraints Data collection: local software; cell refinement: local software; data reduction: local software; program(s) used to solve structure: coordinates taken from a related compound; program(s) used to refine structure: FULLPROF (Rodriguez-Carvajal, 2001 ▶); molecular graphics: VESTA (Momma & Izumi, 2008 ▶); software used to prepare material for publication: publCIF (Westrip, 2010 ▶). Click here for additional data file. Crystal structure: contains datablock(s) global, I. DOI: 10.1107/S1600536812048921/wm2699sup1.cif Click here for additional data file. Rietveld powder data: contains datablock(s) I. DOI: 10.1107/S1600536812048921/wm2699Isup2.rtv Additional supplementary materials: crystallographic information; 3D view; checkCIF report
Sr2TiSi2O8Dx = 3.890 (1) Mg m3
Mr = 407.31Synchrotron radiation, λ = 0.207549 Å
Tetragonal, P4bmµ = 0.43 mm1
Hall symbol: P 4 -2abT = 293 K
a = 8.3200 (3) ÅParticle morphology: powder
c = 5.0239 (2) Åwhite
V = 347.77 (2) Å3cylinder, 20 × 0.7 mm
Z = 2Specimen preparation: Prepared at 1323 K and 100 kPa
In-house design diffractometerData collection mode: transmission
Radiation source: SynchrotronScan method: continuous
Laue DCM diamond(111) & Si(111) monochromatormin = 0.053°, 2θmax = 11.915°, 2θstep = 0.008°
Specimen mounting: capillary
Rp = 0.052Excluded region(s): 0-1 and 11.7-12.0 degrees 2θ
Rwp = 0.073Profile function: T-C-H Pseudo-Voigt function
Rexp = 0.03171 parameters
RBragg = 0.0935 restraints
χ2 = 31.068
1476 data points
xyzUiso*/Ueq
Sr10.3282 (2)0.8282 (2)0.017 (2)0.0070 (8)*
Ti10.000000.000000.558 (3)0.007 (2)*
Si10.1305 (6)0.6305 (6)0.535 (3)0.019 (2)*
O10.000000.500000.651 (5)0.017 (3)*
O20.1292 (15)0.6292 (15)0.191 (3)0.017 (3)*
O30.2985 (12)0.5984 (15)0.678 (3)0.017 (3)*
O40.000000.000000.209 (3)0.017 (3)*
Sr1—O1i2.733 (18)Ti1—O3viii1.961 (12)
Sr1—O22.499 (13)Ti1—O3ix1.961 (13)
Sr1—O2ii2.676 (13)Ti1—O41.75 (2)
Sr1—O2iii2.676 (13)Si1—O11.642 (11)
Sr1—O3iv2.572 (15)Si1—O21.73 (2)
Sr1—O3v2.572 (14)Si1—O31.594 (14)
Ti1—O3vi1.961 (12)Si1—O3x1.594 (15)
Ti1—O3vii1.961 (13)
O3xi—Ti1xii—O3xiii84.6 (9)O3x—Ti1xii—O4xii107.9 (12)
O3xi—Ti1xii—O3xiv144.2 (10)O3xiv—Ti1xii—O4xii107.9 (12)
O3xiv—Ti1xii—O3xiii84.6 (8)O1—Si1—O2110.3 (16)
O3xi—Ti1xii—O4xii107.9 (12)O1—Si1—O3x108.0 (9)
O3xiv—Ti1xii—O3x84.6 (8)O1—Si1—O3108.0 (10)
O3xiii—Ti1xii—O3x144.2 (11)O2—Si1—O3117.1 (15)
O3xiii—Ti1xii—O4xii107.9 (12)O2—Si1—O3x117.1 (15)
O3x—Ti1xii—O3xi84.6 (9)O3x—Si1—O395.2 (11)
  2 in total

1.  Viscous fingering and dendritic growth of surface crystallized Sr2TiSi2O8 fresnoite.

Authors:  Wolfgang Wisniewski; Marek Patschger; Christian Rüssel
Journal:  Sci Rep       Date:  2013-12-19       Impact factor: 4.379

2.  Microstructure of transparent strontium fresnoite glass-ceramics.

Authors:  Wolfgang Wisniewski; Kazuya Takano; Yoshihiro Takahashi; Takumi Fujiwara; Christian Rüssel
Journal:  Sci Rep       Date:  2015-03-17       Impact factor: 4.379

  2 in total

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