Literature DB >> 23476165

9,10-Diiodo-phenanthrene.

Ruri Yokota1, Chitoshi Kitamura, Takeshi Kawase.   

Abstract

The whole mol-ecule of the title compound, C14H8I2, is generated by crystallographic twofold symmetry. The mol-ecule is planar [maximum deviation = 0.0323 (6) Å] with the I atoms displaced from the mean plane of the phenanthrene ring system by only 0.0254 (5) Å. In the crystal, mol-ecules form face-to-face slipped anti-parallel π-π stacking inter-actions along the c axis with an inter-planar distance of 3.499 (7) Å.

Entities:  

Year:  2012        PMID: 23476165      PMCID: PMC3588929          DOI: 10.1107/S1600536812045758

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For the synthesis of the title compound, see: Rodrígeuz-Lojo et al. (2012 ▶). For a related structure, see: Yokota et al. (2012 ▶).

Experimental

Crystal data

C14H8I2 M = 430 Monoclinic, a = 18.094 (2) Å b = 9.4557 (14) Å c = 7.4187 (10) Å β = 111.953 (3)° V = 1177.2 (3) Å3 Z = 4 Mo Kα radiation μ = 5.31 mm−1 T = 223 K 0.52 × 0.08 × 0.05 mm

Data collection

Rigaku R-AXIS RAPID diffractometer Absorption correction: numerical (NUMABS; Higashi, 1999 ▶) T min = 0.388, T max = 0.869 5595 measured reflections 1345 independent reflections 1077 reflections with I > 2σ(I) R int = 0.030

Refinement

R[F 2 > 2σ(F 2)] = 0.033 wR(F 2) = 0.083 S = 1.12 1345 reflections 73 parameters H-atom parameters constrained Δρmax = 0.92 e Å−3 Δρmin = −0.92 e Å−3 Data collection: RAPID-AUTO (Rigaku, 1999 ▶); cell refinement: PROCESS-AUTO (Rigaku, 1998 ▶); data reduction: PROCESS-AUTO; program(s) used to solve structure: SIR2004 (Burla et al., 2005 ▶); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008 ▶); molecular graphics: ORTEP-3 for Windows (Farrugia, 1997 ▶); software used to prepare material for publication: WinGX (Farrugia, 1999 ▶). Click here for additional data file. Crystal structure: contains datablock(s) global, I. DOI: 10.1107/S1600536812045758/jj2155sup1.cif Click here for additional data file. Structure factors: contains datablock(s) I. DOI: 10.1107/S1600536812045758/jj2155Isup2.hkl Click here for additional data file. Supplementary material file. DOI: 10.1107/S1600536812045758/jj2155Isup3.cml Additional supplementary materials: crystallographic information; 3D view; checkCIF report
C14H8I2F(000) = 792
Mr = 430Dx = 2.426 Mg m3
Monoclinic, C2/cMo Kα radiation, λ = 0.71073 Å
Hall symbol: -C 2ycCell parameters from 3465 reflections
a = 18.094 (2) Åθ = 3.1–27.5°
b = 9.4557 (14) ŵ = 5.31 mm1
c = 7.4187 (10) ÅT = 223 K
β = 111.953 (3)°Needle, colorless
V = 1177.2 (3) Å30.52 × 0.08 × 0.05 mm
Z = 4
Rigaku R-AXIS RAPID diffractometer1345 independent reflections
Radiation source: fine-focus sealed x-ray tube1077 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.030
Detector resolution: 10 pixels mm-1θmax = 27.5°, θmin = 3.5°
ω scansh = −23→22
Absorption correction: numerical (NUMABS; Higashi, 1999)k = −12→12
Tmin = 0.388, Tmax = 0.869l = −8→9
5595 measured reflections
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.033H-atom parameters constrained
wR(F2) = 0.083w = 1/[σ2(Fo2) + (0.0077P)2 + 13.1956P] where P = (Fo2 + 2Fc2)/3
S = 1.12(Δ/σ)max < 0.001
1345 reflectionsΔρmax = 0.92 e Å3
73 parametersΔρmin = −0.92 e Å3
0 restraints
Geometry. All s.u.'s (except the s.u. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell s.u.'s are taken into account individually in the estimation of s.u.'s in distances, angles and torsion angles; correlations between s.u.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell s.u.'s is used for estimating s.u.'s involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > 2σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.
xyzUiso*/Ueq
C10.3399 (3)0.4417 (6)0.4793 (7)0.0368 (12)
H10.31270.35640.43320.044*
C20.3020 (3)0.5667 (8)0.4155 (8)0.0470 (15)
H20.24880.56690.32750.056*
C30.3408 (3)0.6927 (7)0.4781 (9)0.0467 (15)
H30.31460.77860.43060.056*
C40.4171 (4)0.6931 (6)0.6089 (8)0.0424 (13)
H40.44260.780.65290.051*
C50.4587 (3)0.5675 (5)0.6798 (7)0.0289 (10)
C60.4192 (3)0.4383 (5)0.6137 (7)0.0261 (9)
C70.4618 (3)0.3079 (5)0.6846 (7)0.0281 (10)
I10.40244 (3)0.11933 (4)0.58098 (7)0.05783 (18)
U11U22U33U12U13U23
C10.029 (2)0.051 (3)0.029 (3)0.003 (2)0.008 (2)0.001 (2)
C20.026 (3)0.078 (4)0.034 (3)0.012 (3)0.007 (2)0.010 (3)
C30.038 (3)0.057 (4)0.048 (3)0.024 (3)0.019 (3)0.020 (3)
C40.048 (3)0.040 (3)0.048 (3)0.012 (2)0.028 (3)0.008 (3)
C50.030 (2)0.030 (2)0.031 (3)0.0021 (19)0.017 (2)0.0012 (19)
C60.023 (2)0.035 (2)0.024 (2)0.0010 (18)0.0126 (18)0.0001 (18)
C70.033 (2)0.026 (2)0.025 (2)−0.0029 (18)0.010 (2)−0.0020 (18)
I10.0670 (3)0.0402 (2)0.0526 (3)−0.01527 (19)0.0067 (2)−0.00726 (18)
C1—C21.359 (8)C4—C51.399 (7)
C1—C61.409 (7)C4—H40.94
C1—H10.94C5—C61.408 (7)
C2—C31.372 (9)C5—C5i1.467 (10)
C2—H20.94C6—C71.445 (6)
C3—C41.359 (8)C7—C7i1.360 (9)
C3—H30.94C7—I12.075 (5)
C2—C1—C6120.9 (5)C5—C4—H4119.1
C2—C1—H1119.6C4—C5—C6118.2 (5)
C6—C1—H1119.6C4—C5—C5i121.9 (3)
C1—C2—C3120.7 (5)C6—C5—C5i119.8 (3)
C1—C2—H2119.7C5—C6—C1118.5 (5)
C3—C2—H2119.7C5—C6—C7118.7 (4)
C4—C3—C2119.9 (5)C1—C6—C7122.8 (5)
C4—C3—H3120.1C7i—C7—C6121.5 (3)
C2—C3—H3120.1C7i—C7—I1120.77 (13)
C3—C4—C5121.8 (6)C6—C7—I1117.8 (3)
C3—C4—H4119.1
C6—C1—C2—C31.1 (8)C5i—C5—C6—C7−0.9 (8)
C1—C2—C3—C4−1.6 (9)C2—C1—C6—C5−0.4 (7)
C2—C3—C4—C51.4 (9)C2—C1—C6—C7−179.6 (5)
C3—C4—C5—C6−0.7 (8)C5—C6—C7—C7i1.2 (8)
C3—C4—C5—C5i179.7 (6)C1—C6—C7—C7i−179.6 (6)
C4—C5—C6—C10.2 (7)C5—C6—C7—I1−179.0 (3)
C5i—C5—C6—C1179.8 (5)C1—C6—C7—I10.2 (6)
C4—C5—C6—C7179.5 (5)
  3 in total

1.  Aryne insertion into I-I σ-bonds.

Authors:  Diego Rodríguez-Lojo; Agustín Cobas; Diego Peña; Dolores Pérez; Enrique Guitián
Journal:  Org Lett       Date:  2012-03-08       Impact factor: 6.005

2.  A short history of SHELX.

Authors:  George M Sheldrick
Journal:  Acta Crystallogr A       Date:  2007-12-21       Impact factor: 2.290

3.  9,10-Dibromo-phenanthrene.

Authors:  Ruri Yokota; Chitoshi Kitamura; Takeshi Kawase
Journal:  Acta Crystallogr Sect E Struct Rep Online       Date:  2012-10-20
  3 in total

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