Literature DB >> 23449368

A comparison of neon versus helium ion beam induced deposition via Monte Carlo simulations.

Rajendra Timilsina1, Daryl A Smith, Philip D Rack.   

Abstract

The ion beam induced nanoscale synthesis of PtCx (where x ∼ 5) using the trimethyl (methylcyclopentadienyl)platinum(IV) (MeCpPt(IV)Me3) precursor is investigated by performing Monte Carlo simulations of helium and neon ions. The helium beam leads to more lateral growth relative to the neon beam because of its larger interaction volume. The lateral growth of the nanopillars is dominated by molecules deposited via secondary electrons in both the simulations. Notably, the helium pillars are dominated by SE-I electrons whereas the neon pillars are dominated by SE-II electrons. Using a low precursor residence time of 70 μs, resulting in an equilibrium coverage of ∼4%, the neon simulation has a lower deposition efficiency (3.5%) compared to that of the helium simulation (6.5%). At larger residence time (10 ms) and consequently larger equilibrium coverage (85%) the deposition efficiencies of helium and neon increased to 49% and 21%, respectively; which is dominated by increased lateral growth rates leading to broader pillars. The nanoscale growth is further studied by varying the ion beam diameter at 10 ms precursor residence time. The study shows that total SE yield decreases with increasing beam diameters for both the ion types. However, helium has the larger SE yield as compared to that of neon in both the low and high precursor residence time, and thus pillars are wider in all the simulations studied.

Entities:  

Year:  2013        PMID: 23449368     DOI: 10.1088/0957-4484/24/11/115302

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  2 in total

1.  Direct Write of 3D Nanoscale Mesh Objects with Platinum Precursor via Focused Helium Ion Beam Induced Deposition.

Authors:  Alex Belianinov; Matthew J Burch; Anton Ievlev; Songkil Kim; Michael G Stanford; Kyle Mahady; Brett B Lewis; Jason D Fowlkes; Philip D Rack; Olga S Ovchinnikova
Journal:  Micromachines (Basel)       Date:  2020-05-22       Impact factor: 2.891

2.  Monte Carlo simulation of nanoscale material focused ion beam gas-assisted etching: Ga+ and Ne+ etching of SiO2 in the presence of a XeF2 precursor gas.

Authors:  Kyle T Mahady; Shida Tan; Yuval Greenzweig; Amir Raveh; Philip D Rack
Journal:  Nanoscale Adv       Date:  2019-07-30
  2 in total

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