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Literature DB >> 23431181

Surface layering and melting in an ionic liquid studied by resonant soft X-ray reflectivity.

Markus Mezger¹, Benjamin M Ocko, Harald Reichert, Moshe Deutsch.

Abstract

The molecular-scale structure of the ionic liquid [C18mim](+)[FAP](-) near its free surface was studied by complementary methods. X-ray absorption spectroscopy and resonant soft X-ray reflectivity revealed a depth-decaying near-surface layering. Element-specific interfacial profiles were extracted with submolecular resolution from energy-dependent soft X-ray reflectivity data. Temperature-dependent hard X-ray reflectivity, small- and wide-angle X-ray scattering, and infrared spectroscopy uncovered an intriguing melting mechanism for the layered region, where alkyl chain melting drove a negative thermal expansion of the surface layer spacing.

Year: 2013 PMID： 23431181 PMCID： PMC3593890 DOI： 10.1073/pnas.1211749110

Source DB: PubMed Journal: Proc Natl Acad Sci U S A ISSN： 0027-8424 Impact factor: 11.205

19 in total

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8. Layering of [BMIM]+-based ionic liquids at a charged sapphire interface.

Authors: Markus Mezger; Sebastian Schramm; Heiko Schröder; Harald Reichert; Moshe Deutsch; Emerson J De Souza; John S Okasinski; Benjamin M Ocko; Veijo Honkimäki; Helmut Dosch
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9. Surface layering in ionic liquids: an X-ray reflectivity study.

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10. Influence of different substituents on the surface composition of ionic liquids studied using ARXPS.

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4. Determining chemically and spatially resolved atomic profile of low contrast interface structure with high resolution.

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