| Literature DB >> 23301160 |
B Yang1, Y T Zhou, D Chen, X L Ma.
Abstract
Dislocations in crystals are linear crystallographic defects, which move in lattice when crystals are plastically deformed. Motion of a partial dislocation may remove or create stacking fault characterized with a partial of a lattice translation vector. Here we report that motion of partial dislocations inside an intermetallic compound result in a local composition deviation from its stoichiometric ratio, which cannot be depicted with any vectors of the primary crystal. Along dislocation slip bands inside the deformed Al(2)Cu particles, redistribution of Cu and Al atoms leads to a local decomposition and collapse of the original crystal structure. This finding demonstrates that dislocation slip may induce destabilization in complex compounds, which is fundamentally different from that in monometallic crystals. This phenomenon of chemical unmixing of initially homogeneous multicomponent solids induced by dislocation motion might also have important implications for understanding the geologic evolvement of deep-focus peridotites in the Earth.Entities:
Year: 2013 PMID: 23301160 PMCID: PMC3539146 DOI: 10.1038/srep01039
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1(a) HAADF image showing the microstructural characteristics of the as-received dual-phase material. The particles embedded in Al matrix are tetragonal θ-Al2Cu precipitates, verified by X-ray diffraction and a series of electron diffraction patterns. (b) HAADF image of an area within a single crystalline Al2Cu precipitate along [001] crystallographic direction (see inset). (c) and (d) are elemental maps of Al and Cu, respectively, corresponding to the area squared in (b). Both Al and Cu are homogeneously distributed. (e) Micrograph showing an array of dislocations in the precipitate induced by deformation. (f) Bright-field TEM image showing slip bands on (110) crystallographic planes in an Al2Cu particle. (g) HAADF image of the same area as that in (f) shows clear contrast variation along the slip band. The bottom-left inset is a section along this slip band marked with black rectangle. The up-left inset is an EDP of zone axis from the area marked with a black circle.
Figure 2(a) HAADF image of a section along a typical slip band. It is seen that the morphology of Cu-rich areas ranges from circular to elliptical, and sometimes irregular. (b) and (c) are Al and Cu maps, respectively, obtained from the area marked with a white rectangle in (a). A darker ring in (b) corresponding to the brighter ring in (c) is poor of Al and rich of Cu. (d) is EDS profiles showing the local composition fluctuation along the slip band. The scanning route for this EDS profile is perpendicular to the slip band marked with a white vertical line in (a). (e) Cu-map along the slip band, where the intensity of Cu is varied. (f) EDP taken in the area close to the slip band. (g–i) EDPs taken at different Cu-poor areas along the slip band. These EDPs can be no longer indexed to tetragonal Al2Cu due to decomposition and structural collapse.
Figure 3(a) HREM image obtained from direction showing a dislocation array with a slip system [001](110). Burgers circuit is outlined for each dislocation, which exhibits the lattice displacement of 1/2[001] in this projection. (b) High magnification image of the partial dislocation (left partial in (A)). Stacking fault in the right of dislocation core (“⊥”) is not resolved since the atomic projections of (001) and 1/2(001) planes are the same. (c) Atomic structural model of the partials viewed along the dislocation line. Here, atoms in three sub-layers (x = 0, 0.096, 0.25) are selected for projection in order to distinguish the two cores. The partial changes the stacking of the crystal (vertical direction in this schematic representation), i.e. it either removes or creates a stacking fault. The whole configuration of two partials and stacking fault (an ellipsis between two cores are marked) is called an extended dislocation.
Figure 4(a) Schematic of the computational cell used for MD simulations. The dislocation is indicated with “⊥”; and the stacking fault area (in the left of the core) is also marked. (b) Cell for MD simulation, where partial dislocation is involved. (c–e) Snapshots of the atomic configuration at 14,000, 200,000, and 400,000 timesteps, respectively. In (b–e), the green spheres denote Al and the brown spheres Cu atoms, respectively. (f) Atomistic configurations projected along direction where perfect area, partial core, and stacking fault are represented. (g) and (h) show a continuous motion of dislocation leaves behind Cu displacements (red-arrowed) around the slip plane. (i–m) MD simulation indicates that the two partials tend to move toward each other (see the length changing of the double-arrowed bars in the figure). Colored according to the displacement values (), the plots display an evolution of Cu displacement at 6,000, 10,000, 16,000, 30,000, and 240,000 timesteps, respectively. In (i–l), the displacement values are from 0 to 1 Å; while in (M) the range is 0~7Å. The additional peaks between the two partials in (j, k, l) are believed to result from the local distortion under stress in the stacking fault area.