| Literature DB >> 23296328 |
Aljaž Pogačnik1, Tomaž Požar, Mitjan Kalin, Janez Možina.
Abstract
We report on the successful realization of a contactless, non-perturbing, displacement-measuring system for characterizing the surface roughness of polymer materials used in tribological applications. A single, time-dependent, scalar value, dubbed the collective micro-asperity deformation, is extracted from the normal-displacement measurements of normally loaded polymer samples. The displacement measurements with a sub-nanometer resolution are obtained with a homodyne quadrature laser interferometer. The measured collective micro-asperity deformation is critical for a determination of the real contact area and thus for the realistic contact conditions in tribological applications. The designed measuring system senses both the bulk creep as well as the micro-asperity creep occurring at the roughness peaks. The final results of our experimental measurements are three time-dependent values of the collective micro-asperity deformation for the three selected surface roughnesses. These values can be directly compared to theoretical deformation curves, which can be derived using existing real-contact-area models.Entities:
Year: 2013 PMID: 23296328 PMCID: PMC3574698 DOI: 10.3390/s130100703
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Nomenclature.
| Out-of-plane displacement | m | |
| Distance from the top of the metal mirror to the bottom of the PA6 polymer (uncompressed) | m | |
| Δ | Absolute contraction of | m |
| Δ | Collective micro-asperity deformation | m |
| Distance between the bottom part of the PA6 polymer before and during loading | m | |
| Arithmetic average of the absolute values of the surface profile | m | |
| Wavelength of the He-Ne laser beam in air under standard conditions | m | |
| Vacuum wavelength of the He-Ne laser beam | m | |
| Loading force | N | |
| Time | s | |
| Δ | Sampling period | s |
| Output signal from the photodiode PDx | V | |
| Output signal from the photodiode PDy | V | |
| Photodiode output voltage when it collects the power | V | |
| Laser output power | W | |
| Laser beam power | W | |
| Δ | Frequency bandwidth of the detector | Hz |
| Positive integer | 1 | |
| The refractive index of the air | 1 | |
| Integers | 1 | |
| Optical phase | rad | |
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|
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| S | Smooth | |
| R | Rough | |
| A | Asperity | |
| V | Vacuum | |
| PA6 | Polyamide 6 polymer | |
| PTFE | Polytetrafluoroethylene (Teflon) | |
| ADC | Analogue-to-digital converter | |
| DC | Direct current (zero frequency) | |
| HQLI | Homodyne quadrature laser interferometer | |
| DSO | Digital sampling oscilloscope | |
| PDx | Photodiode measuring the horizontally polarized light | |
| PDy | Photodiode measuring the vertically polarized light | |
| PBS | Polarizing beam splitter | |
| NBS | Nonpolarizing beam splitter | |
| Uncertainty | ||
| Octadic wave plate | ||
| OFI | Optical Faraday isolator | |
| AE | Acoustic emission | |
| Env | Environmental | |
Figure 1.Measuring geometry at two time instances.
Figure 2.Optical setup of the homodyne quadrature laser interferometer (HQLI) and a schematic view of the lever press.
Figure 3.Block diagram of the signal processing.
Figure 4.(a) Displacement history curves for the smooth surface uS, for the rough surface uR of R = 1.5 μm, and for the corresponding collective micro-asperity deformation ΔhA. (b) Collective micro-asperity deformations for three different surface roughnesses.