| Literature DB >> 23245385 |
Daniel Grimm1, Carlos Cesar Bof Bufon, Christoph Deneke, Paola Atkinson, Dominic J Thurmer, Franziska Schäffel, Sandeep Gorantla, Alicja Bachmatiuk, Oliver G Schmidt.
Abstract
We fabricate inorganic thin film transistors with bending radii of less than 5 μm maintaining their high electronic performance with on-off ratios of more than 10(5) and subthreshold swings of 160 mV/dec. The fabrication technology relies on the roll-up of highly strained semiconducting nanomembranes, which compacts planar transistors into three-dimensional tubular architectures opening intriguing potential for microfluidic applications. Our technique probes the ultimate limit for the bending radius of high performance thin film transistors.Year: 2012 PMID: 23245385 DOI: 10.1021/nl303887b
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189