| Literature DB >> 23215328 |
J Girard1, G Scherrer, A Cattoni, E Le Moal, A Talneau, B Cluzel, F de Fornel, A Sentenac.
Abstract
We demonstrate experimentally a subdiffraction light pattern, with a period down to 150 nm, at the surface of an optimized silicon nanostructured thin film. We show, using near-field and far-field characterization, that this subdiffraction pattern can be translated and rotated just by changing the illumination angle. The movable high frequency light pattern paves the way for subdiffraction resolution surface imaging microscopy without scanning near-field probes.Entities:
Mesh:
Substances:
Year: 2012 PMID: 23215328 DOI: 10.1103/PhysRevLett.109.187404
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161