| Literature DB >> 23149776 |
Chris J Mart1, Howard R Elson, Michael A S Lamba.
Abstract
Some of the lowest voltages used in radiotherapy are termed Grenz and superficial X-rays of ~ 20 and ~ 100 kVp, respectively. Dosimetrically, the surface doses from these beams are calculated with the use of a free in-air air kerma measurement combined with a backscatter factor and the appropriate ratio of mass energy absorption coefficients from the measurement material to water. Alternative tools to the standard ion chamber for measuring the BSF are GAFCHROMIC EBT2 film and optically stimulated luminescent dosimeter (OSLD) crystals made from Al2O3. The scope of this project included making three different backscatter measurements with an Xstrahl-D3100 X-ray unit on the Grenz ray and superficial settings. These measurements were with OSLDs, GAFCHROMIC EBT2 film, and a PTW ionization chamber. The varied measurement methods allowed for intercomparison to determine the accuracy of the results. The ion chamber measurement was the least accurate, as expected from previous experimental findings. GAFCHROMIC EBT2 film proved to be a useful tool which gave reasonable results, and Landauer OSLDs showed good results for smaller field sizes and an increasing overresponse with larger fields. The specific backscatter factors for this machine demonstrated values about 5% higher than the universal values suggested by the AAPM and IPEMB codes of practice for the 100 kVp setting. The 20 kvp measured data from both techniques showed general agreement with those found in the BJR Supplement No. 10, indicating that this unit's Grenz ray spectrum is similar to those used in previous experimental work.Entities:
Mesh:
Year: 2012 PMID: 23149776 PMCID: PMC5718537 DOI: 10.1120/jacmp.v13i6.3832
Source DB: PubMed Journal: J Appl Clin Med Phys ISSN: 1526-9914 Impact factor: 2.102
Figure 16 MV EBT2 film calibration showing film OD plotted vs. dose.
100kVp backscatter factor results. The BSF data from both film and OSLD measurements are listed along with published data from the IPEMB corresponding to the appropriate cone sizes, FSDs, and HVTs. The first row of p‐values is calculated between each of the film and OSLD data and the IPEMB values, while the second row of p‐values is calculated between the film and OSLD values.
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| 2 cm | 1.18 | 1.16 | 1.12 | |
| 0 | 0.08 | 0.01 | ||
| p | 0.211 | 0.000 | ||
| p | 0.601 | |||
| 4 cm | 1.21 | 1.21 | 1.20 | |
| 0 | 0.07 | 0.02 | ||
| p | 0.802 | 0.467 | ||
| p | 0.992 | |||
| 6 cm | 1.29 | 1.32 | 1.25 | |
| 0 | 0.07 | 0.01 | ||
| p | 0.262 | 0.000 | ||
| p | 0.291 | |||
| 8 cm | 1.36 | 1.35 | 1.29 | |
| 0 | 0.10 | 0.02 | ||
| p | 0.139 | 0.002 | ||
| p | 0.801 | |||
| 10 cm | 1.39 | 1.51 | 1.32 | |
| 0 | 0.07 | 0.04 | ||
| p | 0.090 | 0.000 | ||
| p | 0.006 | |||
| 15 cm | 1.28 | 1.48 | 1.37 | |
| 0 | 0.05 | 0.03 | ||
| p | 0.007 | 0.000 | ||
| p | 0.000 |
20kVp backscatter factor results. The BSF data from both film and OSLD measurements are listed along with published data from BJR Supplement No. 10 corresponding to the appropriate HVTs. The first row of p‐values is calculated between each of the film and OSLD data and the BJR values while the second row of p‐values is calculated between the film and OSLD values.
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| 2cm | 1.10 | 0.97 | 1.01 | |
| 0 | 0.04 | 0.04 | ||
| p | 0.034 | 0.224 | ||
| p | 0.032 | |||
| 4cm | 1.12 | 0.99 | 1.02 | |
| 0 | 0.03 | 0.05 | ||
| p | 0.010 | 0.434 | ||
| p | 0.032 | |||
| 6cm | 1.00 | 1.01 | 1.03 | |
| 0 | 0.02 | 0.05 | ||
| p | 0.053 | 0.570 | ||
| p | 0.593 | |||
| 8cm | 1.07 | 0.96 | 1.04 | |
| 0 | 0.06 | 0.05 | ||
| p | 0.545 | 0.075 | ||
| p | 0.098 | |||
| 10cm | 1.02 | 1.07 | 1.05 | |
| 0 | 0.05 | 0.11 | ||
| p | 0.379 | 0.834 | ||
| p | 0.539 | |||
| 15cm | 1.03 | 0.86 | 1.06 | |
| 0 | 0.04 | 0.02 | ||
| p | 0.418 | 0.000 | ||
| p | 0.023 |
Measured half‐value thicknesses for both beam energies.
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| 100 | 3.97 |
| 20 | .0816 |