Literature DB >> 23142745

Detector non-uniformity in scanning transmission electron microscopy.

S D Findlay1, J M LeBeau.   

Abstract

A non-uniform response across scanning transmission electron microscope annular detectors has been found experimentally, but is seldom incorporated into simulations. Through case study simulations, we establish the nature and scale of the discrepancies which may arise from failing to account for detector non-uniformity. If standard detectors are used at long camera lengths such that the detector is within or near to the bright field region, we find errors in contrast of the order of 10%, sufficiently small for qualitative work but non-trivial as experiments become more quantitative. In cases where the detector has been characterized in advance, we discuss the detector response normalization and how it may be incorporated in simulations.
Copyright © 2012 Elsevier B.V. All rights reserved.

Mesh:

Year:  2012        PMID: 23142745     DOI: 10.1016/j.ultramic.2012.09.001

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  2 in total

1.  Variable-angle high-angle annular dark-field imaging: application to three-dimensional dopant atom profiling.

Authors:  Jack Y Zhang; Jinwoo Hwang; Brandon J Isaac; Susanne Stemmer
Journal:  Sci Rep       Date:  2015-07-24       Impact factor: 4.379

2.  Quantitative annular dark-field imaging of single-layer graphene-II: atomic-resolution image contrast.

Authors:  Shunsuke Yamashita; Shogo Koshiya; Takuro Nagai; Jun Kikkawa; Kazuo Ishizuka; Koji Kimoto
Journal:  Microscopy (Oxf)       Date:  2015-09-07       Impact factor: 1.571

  2 in total

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