Literature DB >> 23137904

A new approach to the investigation of nanoparticles: electron tomography with compressed sensing.

John Meurig Thomas1, Rowan Leary2, Paul A Midgley3, Daniel J Holland4.   

Abstract

The principal purpose of this contribution is to illustrate the potential of compressed sensing electron tomography for the characterisation of nanoparticulate materials that are vulnerable to electron beam damage. Not only is there growing interest in nanoparticles of organic materials in medical and allied contexts, there is also the need to investigate nanoparticles and nanoclusters of metals supported on biological macromolecular entities in the context of drug delivery. A qualitative account of the principles of electron tomography is outlined with illustrations from the field of heterogeneous catalysis, where electron beam damage is less of an issue, and an appendix deals with more quantitative aspects of how compressed sensing promises to expand the range of samples that have hitherto been accessible to investigation.
Copyright © 2012 Elsevier Inc. All rights reserved.

Mesh:

Year:  2012        PMID: 23137904     DOI: 10.1016/j.jcis.2012.09.068

Source DB:  PubMed          Journal:  J Colloid Interface Sci        ISSN: 0021-9797            Impact factor:   8.128


  4 in total

1.  Electron tomography simulator with realistic 3D phantom for evaluation of acquisition, alignment and reconstruction methods.

Authors:  Xiaohua Wan; Tsvi Katchalski; Christopher Churas; Sreya Ghosh; Sebastien Phan; Albert Lawrence; Yu Hao; Ziying Zhou; Ruijuan Chen; Yu Chen; Fa Zhang; Mark H Ellisman
Journal:  J Struct Biol       Date:  2017-04-06       Impact factor: 2.867

2.  Making the Most of your Electrons: Challenges and Opportunities in Characterizing Hybrid Interfaces with STEM.

Authors:  Stephanie M Ribet; Akshay A Murthy; Eric W Roth; Roberto Dos Reis; Vinayak P Dravid
Journal:  Mater Today (Kidlington)       Date:  2021-06-19       Impact factor: 31.041

3.  Biological application of Compressed Sensing Tomography in the Scanning Electron Microscope.

Authors:  Matteo Ferroni; Alberto Signoroni; Andrea Sanzogni; Luca Masini; Andrea Migliori; Luca Ortolani; Alessandro Pezza; Vittorio Morandi
Journal:  Sci Rep       Date:  2016-09-20       Impact factor: 4.379

Review 4.  Advanced electron crystallography through model-based imaging.

Authors:  Sandra Van Aert; Annick De Backer; Gerardo T Martinez; Arnold J den Dekker; Dirk Van Dyck; Sara Bals; Gustaaf Van Tendeloo
Journal:  IUCrJ       Date:  2016-01-01       Impact factor: 4.769

  4 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.