| Literature DB >> 23112612 |
Zimo Lu1, Dante J Dorantes-Gonzalez, Kun Chen, Fei Yang, Baoyin Jin, Yanning Li, Zhi Chen, Xiaotang Hu.
Abstract
In this paper, a polyvinylidene fluoride (PVDF) piezoelectric transducer was developed to detect laser-induced surface acoustic waves in a SiO(2)-thin film-Si-substrate structure. In order to solve the problems related to, firstly, the position of the probe, and secondly, the fact that signals at different points cannot be detected simultaneously during the detection process, a four-quadrant surface acoustic wave PVDF transducer was designed and constructed for the purpose of detecting surface acoustic waves excited by a pulse laser line source. The experimental results of the four-quadrant piezoelectric detection in comparison with the commercial nanoindentation technology were consistent, the relative error is 0.56%, and the system eliminates the piezoelectric surface wave detection direction deviation errors, improves the accuracy of the testing system by 1.30%, achieving the acquisition at the same time at different testing positions of the sample.Entities:
Keywords: PVDF transducer; four-quadrant arrangement; laser-induced surface acoustic wave; piezoelectric transducer
Year: 2012 PMID: 23112612 PMCID: PMC3472840 DOI: 10.3390/s120810500
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Figure 1.Wave front of SAW on Si sample: (a) wave front excited by a point source, (b) wave front excited by a line source.
Figure 2.PVDF piezoelectric sensor: (a) schematic structure of PVDF foil piezoelectric transducer; (b) PVDF foil piezoelectric transducer physical picture.
Figure 3.Four-quadrant PVDF foil piezoelectric SAW transducer.
Figure 4.Four-quadrant wedge probes.
Figure 5.PVDF piezoelectric transducer SAW detection system schematic diagram.
Physical parameters of thermal oxidation of SiO2/Si samples.
| density (kg/m3) | 1,300 | 2,300 |
| Poisson's ratio | 0.26 | 0.27 |
| Elastic constant (1010 N/m2) | c11, c12, c13, c22, c44 | c11 = 16.57, c12 = 6.39, c44 = 7.956 |
| Film thickness (nm) | 230 | – |
| Young's modulus (GPa) | To be measured | 160 |
Figure 6.Waveform in time domain when the detecting line deviates 1 degree.
Figure 7.Overlapped waveforms in time domain when the detecting line coincides with the propagating direction.
Figure 8.Dispersion curve fitting results.
Figure 9.Nanoindentation loading and unloading curves.
The comparison between the results of the nanoindentation and the four-quadrant piezoelectric detection techniques.
| Young's modulus value for the SiO2/Si sample | 71.147 GPa | 71.543 GPa | 72.46 7 GPa |
| Relative error (%) | – | 0.56 | 1.86 |