| Literature DB >> 23110795 |
Yueqiang Lin1, Jian Li, Lihua Lin, Xiaodong Liu, Longlong Chen, Jun Fu.
Abstract
BACKGROUND: Ni2O3- γ-Fe2O3 composite nanoparticles coated with a layer of 2FeCl3·5H2O can be prepared by co-precipitation and processing in FeCl2 solution. Using vibrating sample magnetometer (VSM), X-ray diffraction (XRD), transmission electron microscopy (TEM) and X-ray photoelectron spectroscopy (XPS) diffraction techniques, the dependence of the preparation on the concentration of the FeCl2 treatment solution is revealed.Entities:
Year: 2012 PMID: 23110795 PMCID: PMC3532291 DOI: 10.1186/1752-153X-6-127
Source DB: PubMed Journal: Chem Cent J ISSN: 1752-153X Impact factor: 4.215
Figure 1Specific magnetization curves for the samples.
Figure 2XRD patterns for the samples.
Figure 3TEM images for the samples.
Figure 4High-resolution TEM image of the particle from sample (3).
Figure 5XPS results: Fe2p(a), O1s(b), Ni2p(c) and Cl1s(d).
Binding energy data for the elements of the samples from XPS(eV)
| (1) | 710.50 | 530.04 | 854.93 | 197.66 |
| (2) | 710.66 | 530.13 | 855.10 | 197.73 |
| (3) | 710.36 | 530.11 | 854.96 | 198.08 |
| (4) | 710.43 | 530.04 | 855.04 | 197.95 |
| (5) | 710.86 | 530.34 | 855.66 | 198.35 |
| Fe2O3 | 710.70 | 529.80 | | |
| Ni2O3 | | 531.80 | 855.60 | |
| FeCl3 | 711.08 | 198.72 |
Note. The standard data for Fe2O3, Ni2O3, and FeCl3 are taken from the HANDBOOK OF X-RAY PHOTOELECTRON SPECTROSCOPY By C. D. Wanger, W. M. Riggs, L. E. Davis, J. F. Moulder, G. E. Muilenberg (Editor).
The atomic percentages of Fe, O, Ni and Cl from XPS measurement and the molar ratio of Ni2O3/FeCl3
| Ni2O3/ FeCl3 | ||||||||
|---|---|---|---|---|---|---|---|---|
| (1) | 13.79 | 72.50 | 8.56 | 5.15 | 1 | 0.62 | 0.37 | 1/0.40 |
| (2) | 15.48 | 74.94 | 5.88 | 4.58 | 1 | 0.38 | 0.30 | 1/0.53 |
| (3) | 19.21 | 71.06 | 4.15 | 5.58 | 1 | 0.22 | 0.29 | 1/0.89 |
| (4) | 16.74 | 75.45 | 3.11 | 4.70 | 1 | 0.19 | 0.28 | 1/1.02 |
| (5) | 18.71 | 67.21 | 1.84 | 12.25 | 1 | 0.10 | 0.65 | |
Figure 6The schematic cross-section of the particle detected by XPS for the samples (1), (2), (3) and (4). Note: .