| Literature DB >> 23041919 |
M Vishwas1, K Narasimha Rao, R P S Chakradhar.
Abstract
Titanium dioxide (TiO(2)) thin films were deposited on fused quartz substrates by electron beam evaporation method at room temperature. The films were annealed at different temperatures in ambient air. The surface morphology/roughness at different annealing temperatures were analyzed by atomic force microscopy (AFM). The crystallinity of the film has improved with the increase of annealing temperature. The effect of annealing temperature on optical, photoluminescence and Raman spectra of TiO(2) films were investigated. The refractive index of TiO(2) films were studied by envelope method and reflectance spectra and it is observed that the refractive index of the films was high. The photoluminescence intensity corresponding to green emission was enhanced with increase of annealing temperature. The peaks in Raman spectra depicts that the TiO(2) film is of anatase phase after annealing at 300°C and higher. The films show high refractive index, good optical quality and photoluminescence characteristics suggest that possible usage in opto-electronic and optical coating applications.Entities:
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Year: 2012 PMID: 23041919 DOI: 10.1016/j.saa.2012.09.009
Source DB: PubMed Journal: Spectrochim Acta A Mol Biomol Spectrosc ISSN: 1386-1425 Impact factor: 4.098