Literature DB >> 23038560

Highly reliable Ag/Zn/Ag ohmic reflector for high-power GaN-based vertical light-emitting diode.

Woong-Sun Yum1, Joon-Woo Jeon, Jun-Suk Sung, Tae-Yeon Seong.   

Abstract

We report the improved performance of InGaN/GaN-based light-emitting diodes (LEDs) through Ag reflectors combined with a Zn middle layer. It is shown that the Zn middle layer (5 nm thick) suppresses the agglomeration of Ag reflectors by forming ZnO and dissolving into Ag. The Ag/Zn/Ag contacts show a specific contact resistance of 6.2 × 10(-5) Ωcm(2) and reflectance of ~83% at a wavelength of 440 nm when annealed at 500 °C, which are much better than those of Ag only contacts. Blue LEDs fabricated with the 500 °C-annealed Ag/Zn/Ag reflectors show a forward voltage of 2.98 V at an injection current of 20 mA, which is lower than that (3.02 V) of LEDs with the annealed Ag only contacts. LEDs with the 500 °C-annealed Ag/Zn/Ag contacts exhibit 34% higher output power (at 20 mA) than LEDs with the annealed Ag only contacts.

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Year:  2012        PMID: 23038560     DOI: 10.1364/OE.20.019194

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  1 in total

1.  Optimization of annealing conditions for Ag/p-GaN ohmic contacts.

Authors:  Sai Pan; Youming Lu; Zhibin Liang; Chaojun Xu; Danfeng Pan; Yugang Zhou; Rong Zhang; Youdou Zheng
Journal:  Appl Phys A Mater Sci Process       Date:  2021-10-25       Impact factor: 2.584

  1 in total

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