Literature DB >> 23005019

Precise orientation of a single C60 molecule on the tip of a scanning probe microscope.

C Chiutu1, A M Sweetman, A J Lakin, A Stannard, S Jarvis, L Kantorovich, J L Dunn, P Moriarty.   

Abstract

We show that the precise orientation of a C(60) molecule which terminates the tip of a scanning probe microscope can be determined with atomic precision from submolecular contrast images of the fullerene cage. A comparison of experimental scanning tunneling microscopy data with images simulated using computationally inexpensive Hückel theory provides a robust method of identifying molecular rotation and tilt at the end of the probe microscope tip. Noncontact atomic force microscopy resolves the atoms of the C(60) cage closest to the surface for a range of molecular orientations at tip-sample separations where the molecule-substrate interaction potential is weakly attractive. Measurements of the C(60)-C(60) pair potential acquired using a fullerene-terminated tip are in excellent agreement with theoretical predictions based on a pairwise summation of the van der Waals interactions between C atoms in each cage, i.e., the Girifalco potential [L. Girifalco, J. Phys. Chem. 95, 5370 (1991)].

Entities:  

Year:  2012        PMID: 23005019     DOI: 10.1103/PhysRevLett.108.268302

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  12 in total

Review 1.  Resolving Intra- and Inter-Molecular Structure with Non-Contact Atomic Force Microscopy.

Authors:  Samuel Paul Jarvis
Journal:  Int J Mol Sci       Date:  2015-08-21       Impact factor: 5.923

2.  Nano-contact microscopy of supracrystals.

Authors:  Adam Sweetman; Nicolas Goubet; Ioannis Lekkas; Marie Paule Pileni; Philip Moriarty
Journal:  Beilstein J Nanotechnol       Date:  2015-05-29       Impact factor: 3.649

3.  The role of surface corrugation and tip oscillation in single-molecule manipulation with a non-contact atomic force microscope.

Authors:  Christian Wagner; Norman Fournier; F Stefan Tautz; Ruslan Temirov
Journal:  Beilstein J Nanotechnol       Date:  2014-02-26       Impact factor: 3.649

4.  Structural development and energy dissipation in simulated silicon apices.

Authors:  Samuel Paul Jarvis; Lev Kantorovich; Philip Moriarty
Journal:  Beilstein J Nanotechnol       Date:  2013-12-20       Impact factor: 3.649

5.  Critical assessment of the evidence for striped nanoparticles.

Authors:  Julian Stirling; Ioannis Lekkas; Adam Sweetman; Predrag Djuranovic; Quanmin Guo; Brian Pauw; Josef Granwehr; Raphaël Lévy; Philip Moriarty
Journal:  PLoS One       Date:  2014-11-17       Impact factor: 3.240

6.  Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting.

Authors:  Hongqian Sang; Samuel P Jarvis; Zhichao Zhou; Peter Sharp; Philip Moriarty; Jianbo Wang; Yu Wang; Lev Kantorovich
Journal:  Sci Rep       Date:  2014-10-20       Impact factor: 4.379

7.  Unravelling the multilayer growth of the fullerene C60 in real time.

Authors:  S Bommel; N Kleppmann; C Weber; H Spranger; P Schäfer; J Novak; S V Roth; F Schreiber; S H L Klapp; S Kowarik
Journal:  Nat Commun       Date:  2014-11-05       Impact factor: 14.919

8.  Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor.

Authors:  Julian Stirling; Gordon A Shaw
Journal:  Beilstein J Nanotechnol       Date:  2013-01-08       Impact factor: 3.649

9.  Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces.

Authors:  Adam Sweetman; Andrew Stannard
Journal:  Beilstein J Nanotechnol       Date:  2014-04-01       Impact factor: 3.649

10.  A robust molecular probe for Ångstrom-scale analytics in liquids.

Authors:  Peter Nirmalraj; Damien Thompson; Christos Dimitrakopoulos; Bernd Gotsmann; Dumitru Dumcenco; Andras Kis; Heike Riel
Journal:  Nat Commun       Date:  2016-08-12       Impact factor: 14.919

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