| Literature DB >> 22983609 |
Yu-Chuan Lin1, Wenjing Zhang, Jing-Kai Huang, Keng-Ku Liu, Yi-Hsien Lee, Chi-Te Liang, Chih-Wei Chu, Lain-Jong Li.
Abstract
Atomically thin molybdenum disulfide (MoS(2)) layers have attracted great interest due to their direct-gap property and potential applications in optoelectronics and energy harvesting. Meanwhile, they are extremely bendable, promising for applications in flexible electronics. However, the synthetic approach to obtain large-area MoS(2) atomic thin layers is still lacking. Here we report that wafer-scale MoS(2) thin layers can be obtained using MoO(3) thin films as a starting material followed by a two-step thermal process, reduction of MoO(3) at 500 °C in hydrogen and sulfurization at 1000 °C in the presence of sulfur. Spectroscopic, optical and electrical characterizations reveal that these films are polycrystalline and with semiconductor properties. The obtained MoS(2) films are uniform in thickness and easily transferable to arbitrary substrates, which make such films suitable for flexible electronics or optoelectronics.Entities:
Year: 2012 PMID: 22983609 DOI: 10.1039/c2nr31833d
Source DB: PubMed Journal: Nanoscale ISSN: 2040-3364 Impact factor: 7.790