| Literature DB >> 22939703 |
Ing-Shouh Hwang1, Chih-Wen Yang, Ping-Hsiang Su, En-Te Hwu, Hsien-Shun Liao.
Abstract
We have developed a high-sensitivity atomic force microscopy (AFM) mode operated in aqueous environment based on the torsional resonance of the cantilever. It is found that the torsional mode can achieve a good spatial resolution even with a relatively large tip. We have used this mode to image different soft materials in water, including DNA molecules and purple membrane. High-resolution images of purple membrane can be obtained at a relatively low ion concentration under a long-range electrostatic force. Thus the torsional mode allows investigators to probe surface structures and their properties under a wide range of solution conditions.Entities:
Keywords: Amplitude-modulation; Atomic force microscopy; Flexural resonance; Frequency-modulation; Torsional resonance
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Year: 2012 PMID: 22939703 DOI: 10.1016/j.ultramic.2012.07.001
Source DB: PubMed Journal: Ultramicroscopy ISSN: 0304-3991 Impact factor: 2.689