| Literature DB >> 22900091 |
Irina V Mekhanikova1, Dmitry S Andreev, Olga Yu Belozerova, Yuri L Mikhlin, Sergey V Lipko, Igor V Klimenkov, Vladlen V Akimov, Valeriy F Kargin, Yelena V Mazurova, Vladimir L Tauson, Yelena V Likhoshway.
Abstract
class="abstract_title">BACKGROUND: InEntities:
Mesh:
Year: 2012 PMID: 22900091 PMCID: PMC3416755 DOI: 10.1371/journal.pone.0043073
Source DB: PubMed Journal: PLoS One ISSN: 1932-6203 Impact factor: 3.240
Figure 1Mandible structure and elemental spectrum of the tooth area.
(A) Acanthogammarus grewingkii, external view. The star indicates the centrolateral part of P1 where the AFM and TEM images were taken and XEPMA measurements of elemental composition were made; the circle indicates the location of MD. (B) The distal part of the left MD (SEM). Arrowheads indicate pores. (C) The first IN teeth on the left MD (SEM). The arrow indicates the boundary between the cutting edge and corpus of MD. (D) The cuticular surface of P1 (AFM). Arrowheads indicate pores. (E) The surface of an IN tooth with signs of wear (AFM). (F) An ultrathin section through the EP of P1 (TEM). Arrows indicate pores. (G) An ultrathin section through the external EP of an IN tooth (TEM). (H) X-Ray elemental spectrum of the mapped IN tooth area (SEM-EDS). (I) Apical parts of IN teeth on the right MD, top view. Circles indicate Br-depleted areas (SEM-EDS). (J) The apical part of IN tooth with traces of wearing, top view (SEM). (K) X-Ray map of Br distribution in the apical part of an IN tooth. Arrows indicate Br-depleted areas (SEM-EDS). (L) The layered structure of EP in a section through the IN tooth apex (image in back-scattered electrons in a Superprobe JXA-8200 scanning electron microscope). Stars indicate points of elemental composition measurements.
Figure 2X-Ray elemental spectrum of a polished section of IN and X-Ray element distribution maps (SEM-EDS).
Elemental composition (wt.%) of IN teeth in Acanthogammarus grewingkii (XEPMA).
| EP1 | EP2 | EP3 | Internal tooth tissues | |
| C, O, N | 81.7 | 87.2 | 81.5 | 89.2 |
| Other elements | 18.3 | 12.8 | 18.5 | 10.8 |
| Including: | ||||
| Ca | 1.3±0.5 | 0.6±0.2 | 3.0±1.0 | 6.6±1.0 |
| Br | 16.7±2.0 | 11.3±1.7 | 14.6±1.9 | 0 |
| P | 0 | 0 | 0 | 2.0±0.3 |
| Al | 0.2±0.2 | 0.3±0.3 | 0.9±0.8 | 0.2±0.05 |
| Cl | 0.1±0.1 | 0.6±0.5 | 0 | 1.0±0.2 |
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Note: F, Mg, S, K, Na, Si, Ti, Cr, Fe, Zn, and Sr were detected only at a background level in some layers of IN teeth; n is the number of measurements.
Figure 3X-Ray photoelectron spectra in the range of binding energies of up to 500 eV.
(A) the P1 cuticle and (B) the MD surface (1) before Ar+ etching and after the etching for (2) 2 min and (3) 20 min.
Figure 4X-Ray diffraction pattern of calcite and quartz in the MD of A. grewingkii (XRD).