| Literature DB >> 22898948 |
Joachim Schnadt1, Jan Knudsen, Jesper N Andersen, Hans Siegbahn, Annette Pietzsch, Franz Hennies, Niclas Johansson, Nils Mårtensson, Gunnar Ohrwall, Stephan Bahr, Sven Mähl, Oliver Schaff.
Abstract
The new instrument for near-ambient-pressure X-ray photoelectron spectroscopy which has been installed at the MAX II ring of the Swedish synchrotron radiation facility MAX IV Laboratory in Lund is presented. The new instrument, which is based on a SPECS PHOIBOS 150 NAP analyser, is the first to feature the use of retractable and exchangeable high-pressure cells. This implies that clean vacuum conditions are retained in the instrument's analysis chamber and that it is possible to swiftly change between near-ambient and ultrahigh-vacuum conditions. In this way the instrument implements a direct link between ultrahigh-vacuum and in situ studies, and the entire pressure range from ultrahigh-vacuum to near-ambient conditions is available to the user. Measurements at pressures up to 10(-5) mbar are carried out in the ultrahigh-vacuum analysis chamber, while measurements at higher pressures are performed in the high-pressure cell. The installation of a mass spectrometer on the exhaust line of the reaction cell offers the users the additional dimension of simultaneous reaction data monitoring. Moreover, the chosen design approach allows the use of dedicated cells for different sample environments, rendering the Swedish ambient-pressure X-ray photoelectron spectroscopy instrument a highly versatile and flexible tool.Entities:
Year: 2012 PMID: 22898948 PMCID: PMC3423313 DOI: 10.1107/S0909049512032700
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616
Figure 1(a) Drawing of the HPXPS instrument at the MAX IV Laboratory. (b) Cross-section drawing of the high-pressure cell. At the front in green is the door which is opened for sample transfer. The nozzle is depicted in a golden colour and points at the sample (in brown). Sample heating is achieved through the wall behind the sample by electron bombardment. The double set-up of bellows makes it possible to move the sample during measurement. (c) High-pressure cell during approach to the analyser. (d) Sample loading into the high-pressure cell docked to the analyser. (e) Relationship between real absolute and measured pressure in the gas cell for a number of gases. (f) Relationship between real absolute pressure and pressure in the pre-lens of the PHOIBOS 150 NAP analyser.
Figure 2(a) O 1s X-ray photoelectron spectrum of Pt(111) in 0.15 mbar O2 at 430 K. (b)–(f) O 1s X-ray photoelectron spectra of Pt(111) in a 0.15 mbar 9:1 O2:CO mixture when the crystal is heated from 450 to 535 K. (g) QMS signal from CO, O2 and CO2 acquired simultaneously with the XPS data.