| Literature DB >> 22873841 |
Yasuhiko Hayashi1, Tomoharu Tokunaga, Toru Iijima, Takuya Iwata, Golap Kalita, Masaki Tanemura, Katsuhiro Sasaki, Kotaro Kuroda.
Abstract
Multi-segmented one-dimensional metal nanowires were encapsulated within carbon nanotubes (CNTs) through in-situ filling technique during plasma-enhanced chemical vapor deposition process. Transmission electron microscopy (TEM) and environmental TEM were employed to characterize the as-prepared sample at room temperature and high temperature. The selected area electron diffractions revealed that the Pd4Si nanowire and face-centered-cubic Co nanowire on top of the Pd nanowire were encapsulated within the bottom and tip parts of the multiwall CNT, respectively. Although the strain-induced deformation of graphite walls was observed, the solid-state phases of Pd4Si and Co-Pd remain even at above their expected melting temperatures and up to 1,550 ± 50°C. Finally, the encapsulated metals were melted and flowed out from the tip of the CNT after 2 h at the same temperature due to the increase of internal pressure of the CNT.Entities:
Year: 2012 PMID: 22873841 PMCID: PMC3438045 DOI: 10.1186/1556-276X-7-448
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Figure 1 SEM, TEM, and SAED. (a) Cross-sectional SEM image. (b) TEM images and selected area electron diffractions observed at the bottom part (a, b) and top part (d, e) of the metal nanowire encapsulated within the MWCNT.
Figure 2 Selected area electron diffractions observed at room temperature and 1,300°C, respectively, by ETEM.
Figure 3 TEM images and selected area electron diffractions. Observed at (a) 1,550°C and (b) after 2 h at the same temperature by ETEM.