| Literature DB >> 22783942 |
Mazin M Maqableh1, Xiaobo Huang, Sang-Yeob Sung, K Sai Madhukar Reddy, Gregory Norby, R H Victora, Bethanie J H Stadler.
Abstract
Resistivities of 5.4 μΩ·cm were measured in 10-nm-diameter metallic wires. Low resistance is important for interconnections of the future to prevent heating, electromigration, high power consumption, and long RC time constants. To demonstrate application of these wires, Co/Cu/Co magnetic sensors were synthesized with 20-30 Ω and 19% magnetoresistance. Compared to conventional lithographically produced magnetic tunnel junction sensors, these structures offer facile fabrication and over 2 orders of magnitude lower resistances due to smooth sidewalls from in situ templated chemical growth.Year: 2012 PMID: 22783942 DOI: 10.1021/nl301610z
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189