| Literature DB >> 22772194 |
Anjin Liu1, Feiya Fu, Yufei Wang, Bin Jiang, Wanhua Zheng.
Abstract
We present a polarization-insensitive subwavelength grating reflector based on a semiconductor-insulator-metal structure. The polarization-insensitive characteristic originates from the combined effect of the TM-polarized high-reflectivity high-index-contrast subwavelength grating and the TE-polarized metallic (Au) subwavelength grating with the addition of the insulator layer. The overlapped high reflectivity (>99.5%) bandwidth between the transverse electric polarization and the transverse magnetic polarization is 89 nm. This polarization-insensitive subwavelength grating reflector can be used in the applications without a preferred polarization.Entities:
Year: 2012 PMID: 22772194 DOI: 10.1364/OE.20.014991
Source DB: PubMed Journal: Opt Express ISSN: 1094-4087 Impact factor: 3.894