| Literature DB >> 22764888 |
Axel Eckmann1, Alexandre Felten, Artem Mishchenko, Liam Britnell, Ralph Krupke, Kostya S Novoselov, Cinzia Casiraghi.
Abstract
Raman spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene containing different type of defects. We found that the intensity ratio of the D and D' peak is maximum (∼13) for sp(3)-defects, it decreases for vacancy-like defects (∼7), and it reaches a minimum for boundaries in graphite (∼3.5). This makes Raman Spectroscopy a powerful tool to fully characterize graphene.Entities:
Year: 2012 PMID: 22764888 DOI: 10.1021/nl300901a
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189