| Literature DB >> 22754364 |
Ismail Warad1, Omar Abd-Elkader H2,3, Saud Al-Resayes1, Ahmad Husein4, Mohammed Al-Nuri4, Ahmed Boshaala5, Nabil Al-Zaqri1, Taibi Ben Hadda6.
Abstract
Novel hybrid xerogel materials were synthesized by a sol-gel procedure. n-octadecyltriethoxysilane was co-condensed with and without different cross-linkers using Q(0) and T(0) mono-functionalized organosilanes in the presence of n-hexadecylamine with different hydroxyl silica functional groups at the surface. These polymer networks have shown new properties, for example, a high degree of cross-linking and hydrolysis. Two different synthesis steps were carried out: simple self-assembly followed by sol-gel transition and precipitation of homogenous sols. Due to the lack of solubility of these materials, the compositions of the new materials were determined by infrared spectroscopy, (13)C and (29)Si CP/MAS NMR spectroscopy and scanning electron microscopy.Entities:
Keywords: cross-linkers; sol-gel; solid state NMR; stationary phases
Mesh:
Substances:
Year: 2012 PMID: 22754364 PMCID: PMC3382804 DOI: 10.3390/ijms13056279
Source DB: PubMed Journal: Int J Mol Sci ISSN: 1422-0067 Impact factor: 6.208
Scheme 1Synthesis of xerogels X0–X3: Self-assembly followed by sol-gel process at room temperature using several cross-linkers and the amine as template.
Sol-gel processes, yields and labeling of the materials.
| No. | Xerogel | Cross-Linkers Types | Yield % | Silyl Fragments |
|---|---|---|---|---|
| 1 | - | 60.0 | ||
|
| ||||
| 2 | Si(OEt)4 | 77. 6 | ||
| 3 | Si(OMe)4 | 64.5 | ||
| 4 | MeSi(OMe)3 | 72.5 | ||
Scheme 2The universal 29Si chemical shifts, symbols and orders of silyl species.
Figure 129Si CP/MAS NMR spectra of X0–X3 materials which were prepared by using Si(OEt)4, Si(OMe)4 and MeSi(OMe)3 as cross-linkers.
Figure 213C CP/MAS NMR spectra of X0-X3 materials.
Scheme 3Schematic illustration of trans and gauche alkyl chain arrangements.
Figure 3Infra-red spectra (a and b) of X and X3, before and after sol-gel, respectively.
Figure 4Scanning electron micrograph (SEM) of X2.