| Literature DB >> 22614421 |
Suodong Ma1, Rihong Zhu, Chenggen Quan, Lei Chen, Cho Jui Tay, Bo Li.
Abstract
Structured-light profilometry is a powerful tool to reconstruct the three-dimensional (3D) profile of an object. Accurate profile acquisition is often hindered by not only the nonlinear response (i.e., gamma effect) of electronic devices but also the projection-imaging distortion of lens used in the system. In this paper, a flexible 3D profile reconstruction method based on a nonlinear iterative optimization is proposed to correct the errors caused by the lens distortion. It can be easily extended to measurements for which a more complex projection-imaging distortion model is required. Experimental work shows that the root-mean-square (RMS) error is reduced by eight times and highly accurate results with errors of less than 1‰ can be achieved by the proposed method.Year: 2012 PMID: 22614421 DOI: 10.1364/AO.51.002419
Source DB: PubMed Journal: Appl Opt ISSN: 1559-128X Impact factor: 1.980