Literature DB >> 22589916

5-(4-Methyl-phenyl-sulfon-yl)-1,3-dithiolo[4,5-c]pyrrole-2-thione.

Ning-Juan Zheng1, Bing-Zhu Yin.   

Abstract

The asymmetric unit of the title compound, C(12)H(9)NO(2)S(4), contains one half-mol-ecule with the N, two S amd four C atoms lying on a mirror plane. The mol-ecule exhibits a V-shaped conformation, with a dihedral angle of 87.00 (7)° between the benzene and dithiol-opyrrole rings. The methyl group was treated as rotationally disordered between two orientations in a 1:1 ratio. In the crystal, weak C-H⋯O hydrogen bonds link the mol-ecules into chains in [010].

Entities:  

Year:  2012        PMID: 22589916      PMCID: PMC3344007          DOI: 10.1107/S1600536812009622

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For background to the applications and synthesis of pyrrolo-annulated tetra­thia­fulvalenes, see: Becher et al. (2004 ▶); Hou et al. (2010 ▶). For a related structure, see: Hou et al. (2009 ▶). For details of the synthesis, see: Jeppesen et al.(2000 ▶).

Experimental

Crystal data

C12H9NO2S4 M = 327.44 Monoclinic, a = 15.687 (10) Å b = 10.485 (9) Å c = 8.255 (4) Å β = 96.19 (3)° V = 1349.9 (16) Å3 Z = 4 Mo Kα radiation μ = 0.70 mm−1 T = 290 K 0.46 × 0.43 × 0.40 mm

Data collection

Rigaku R-AXIS RAPID diffractometer Absorption correction: multi-scan (ABSCOR; Higashi, 1995 ▶) T min = 0.740, T max = 0.770 6671 measured reflections 1633 independent reflections 1467 reflections with I > 2σ(I) R int = 0.020

Refinement

R[F 2 > 2σ(F 2)] = 0.029 wR(F 2) = 0.094 S = 1.19 1633 reflections 99 parameters H-atom parameters constrained Δρmax = 0.31 e Å−3 Δρmin = −0.31 e Å−3 Data collection: RAPID-AUTO (Rigaku, 1998 ▶); cell refinement: RAPID-AUTO; data reduction: CrystalStructure (Rigaku/MSC and Rigaku, 2002 ▶); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008 ▶); molecular graphics: SHELXTL (Sheldrick, 2008 ▶); software used to prepare material for publication: SHELXL97. Crystal structure: contains datablock(s) global, I. DOI: 10.1107/S1600536812009622/cv5254sup1.cif Structure factors: contains datablock(s) I. DOI: 10.1107/S1600536812009622/cv5254Isup2.hkl Supplementary material file. DOI: 10.1107/S1600536812009622/cv5254Isup3.cml Additional supplementary materials: crystallographic information; 3D view; checkCIF report
C12H9NO2S4F(000) = 672
Mr = 327.44Dx = 1.611 Mg m3
Monoclinic, C2/mMo Kα radiation, λ = 0.71073 Å
Hall symbol: -C 2yCell parameters from 6182 reflections
a = 15.687 (10) Åθ = 3.3–27.5°
b = 10.485 (9) ŵ = 0.70 mm1
c = 8.255 (4) ÅT = 290 K
β = 96.19 (3)°Block, yellow
V = 1349.9 (16) Å30.46 × 0.43 × 0.40 mm
Z = 4
Rigaku R-AXIS RAPID diffractometer1633 independent reflections
Radiation source: fine-focus sealed tube1467 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.020
ω scansθmax = 27.5°, θmin = 3.3°
Absorption correction: multi-scan (ABSCOR; Higashi, 1995)h = −20→16
Tmin = 0.740, Tmax = 0.770k = −13→13
6671 measured reflectionsl = −10→10
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.029H-atom parameters constrained
wR(F2) = 0.094w = 1/[σ2(Fo2) + (0.053P)2 + 0.4647P] where P = (Fo2 + 2Fc2)/3
S = 1.19(Δ/σ)max = 0.012
1633 reflectionsΔρmax = 0.31 e Å3
99 parametersΔρmin = −0.31 e Å3
0 restraintsExtinction correction: SHELXL97 (Sheldrick, 2008), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.0106 (12)
Experimental. (See detailed section in the paper)
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.
xyzUiso*/UeqOcc. (<1)
C10.40151 (14)0.00000.3618 (3)0.0381 (5)
C20.33159 (9)0.06779 (14)0.61983 (17)0.0328 (3)
C30.29981 (10)0.10896 (15)0.75702 (18)0.0360 (3)
H30.29180.19310.78750.043*
C40.11420 (15)0.00000.8848 (2)0.0352 (4)
C50.07509 (12)0.11519 (17)0.8411 (2)0.0451 (4)
H50.10130.19190.87360.054*
C6−0.00330 (12)0.1139 (2)0.7486 (2)0.0509 (4)
H6−0.02980.19080.71790.061*
C7−0.04379 (16)0.00000.7000 (3)0.0472 (6)
C8−0.12828 (19)0.00000.5964 (3)0.0635 (8)
H8A−0.1210−0.03440.49100.095*0.50
H8B−0.14950.08580.58460.095*0.50
H8C−0.1685−0.05140.64730.095*0.50
N10.28154 (13)0.00000.8431 (2)0.0356 (4)
O10.23189 (8)0.11804 (11)1.07477 (13)0.0442 (3)
S10.21652 (4)0.00000.99190 (6)0.03409 (18)
S20.37336 (3)0.14002 (4)0.45643 (5)0.04288 (17)
S30.45063 (5)0.00000.19690 (8)0.0555 (2)
U11U22U33U12U13U23
C10.0321 (10)0.0470 (13)0.0348 (10)0.0000.0025 (8)0.000
C20.0351 (7)0.0290 (8)0.0338 (7)−0.0026 (6)0.0018 (5)0.0010 (6)
C30.0459 (9)0.0255 (7)0.0369 (8)−0.0028 (6)0.0061 (6)−0.0007 (6)
C40.0448 (12)0.0348 (11)0.0273 (9)0.0000.0094 (8)0.000
C50.0565 (10)0.0380 (9)0.0412 (9)0.0012 (7)0.0069 (7)0.0031 (7)
C60.0521 (10)0.0540 (11)0.0472 (10)0.0090 (8)0.0080 (8)0.0093 (8)
C70.0445 (13)0.0660 (16)0.0329 (11)0.0000.0123 (9)0.000
C80.0496 (16)0.095 (2)0.0456 (14)0.0000.0063 (11)0.000
N10.0482 (11)0.0259 (9)0.0334 (9)0.0000.0073 (7)0.000
O10.0641 (8)0.0342 (6)0.0340 (6)−0.0022 (5)0.0046 (5)−0.0071 (4)
S10.0498 (3)0.0270 (3)0.0257 (3)0.0000.0050 (2)0.000
S20.0525 (3)0.0367 (3)0.0409 (3)−0.00501 (17)0.01189 (18)0.00431 (15)
S30.0545 (4)0.0717 (5)0.0429 (4)0.0000.0168 (3)0.000
C1—S31.635 (2)C5—H50.9300
C1—S21.7423 (17)C6—C71.391 (3)
C1—S2i1.7423 (17)C6—H60.9300
C2—C31.356 (2)C7—C6i1.391 (3)
C2—C2i1.422 (3)C7—C81.498 (4)
C2—S21.7359 (16)C8—H8A0.9600
C3—N11.391 (2)C8—H8B0.9600
C3—H30.9300C8—H8C0.9600
C4—C5i1.385 (2)N1—C3i1.391 (2)
C4—C51.385 (2)N1—S11.679 (2)
C4—S11.747 (3)O1—S11.4221 (14)
C5—C61.376 (3)S1—O1i1.4221 (14)
S3—C1—S2122.58 (7)C6—C7—C8120.86 (12)
S3—C1—S2i122.58 (7)C6i—C7—C8120.86 (12)
S2—C1—S2i114.85 (14)C7—C8—H8A109.5
C3—C2—C2i108.56 (9)C7—C8—H8B109.5
C3—C2—S2135.53 (13)H8A—C8—H8B109.5
C2i—C2—S2115.87 (6)C7—C8—H8C109.5
C2—C3—N1106.24 (15)H8A—C8—H8C109.5
C2—C3—H3126.9H8B—C8—H8C109.5
N1—C3—H3126.9C3—N1—C3i110.37 (18)
C5i—C4—C5121.4 (2)C3—N1—S1123.26 (10)
C5i—C4—S1119.27 (11)C3i—N1—S1123.26 (10)
C5—C4—S1119.27 (11)O1—S1—O1i120.99 (11)
C6—C5—C4118.71 (18)O1—S1—N1105.49 (7)
C6—C5—H5120.6O1i—S1—N1105.49 (7)
C4—C5—H5120.6O1—S1—C4110.02 (7)
C5—C6—C7121.42 (19)O1i—S1—C4110.02 (7)
C5—C6—H6119.3N1—S1—C4103.14 (10)
C7—C6—H6119.3C2—S2—C196.66 (9)
C6—C7—C6i118.3 (2)
D—H···AD—HH···AD···AD—H···A
C3—H3···O1ii0.932.333.243 (3)166
Table 1

Hydrogen-bond geometry (Å, °)

D—H⋯AD—HH⋯ADAD—H⋯A
C3—H3⋯O1i0.932.333.243 (3)166

Symmetry code: (i) .

  3 in total

1.  A short history of SHELX.

Authors:  George M Sheldrick
Journal:  Acta Crystallogr A       Date:  2007-12-21       Impact factor: 2.290

2.  Pyrrolo-annelated tetrathiafulvalenes: the parent systems

Authors: 
Journal:  J Org Chem       Date:  2000-09-08       Impact factor: 4.354

3.  4,6,7,9,10,12-Hexahydro-1,3-dithiolo[4,5-f][1,4,9]oxadithia-cyclo-undecine-2-thione.

Authors:  Rui-Bin Hou; Bao Li; Bing-Zhu Yin; Li-Xin Wu
Journal:  Acta Crystallogr Sect E Struct Rep Online       Date:  2009-06-27
  3 in total

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