Literature DB >> 22588602

Development of Ohmic nanocontacts via surface modification for nanowire-based electronic and optoelectronic devices: ZnO nanowires as an example.

Jr-Hau He1, Jr-Jian Ke, Pei-Hsin Chang, Kun-Tong Tsai, P C Yang, I-Min Chan.   

Abstract

We demonstrated a nanocontacting scheme using a focus ion beam (FIB) system without further heat treatment for ZnO nanowires. This scheme includes Ga ion surface modification and direct-write Pt deposition induced by Ga ion, leading to an Ohmic nanocontact with a specific contact resistance as low as 2.5 × 10(-6)Ω cm(2). Temperature-dependent measurements show that the transport of the FIB-Pt contact on the ZnO nanowire with local surface modification is governed by field emission tunneling. Taking advantage of area-selected and room-temperature processes, Ga ion surface modification and direct-write Pt deposition using a FIB system demonstrates a feasible Ohmic scheme.

Entities:  

Mesh:

Substances:

Year:  2012        PMID: 22588602     DOI: 10.1039/c2nr30688c

Source DB:  PubMed          Journal:  Nanoscale        ISSN: 2040-3364            Impact factor:   7.790


  3 in total

1.  A Self-Powered Fast-Response Ultraviolet Detector of p-n Homojunction Assembled from Two ZnO-Based Nanowires.

Authors:  Yumei Wang; Ying Chen; Wanqiu Zhao; Longwei Ding; Li Wen; Haixia Li; Fan Jiang; Jun Su; Luying Li; Nishuang Liu; Yihua Gao
Journal:  Nanomicro Lett       Date:  2016-10-05

2.  Effects of Applied Voltages on the Charge Transport Properties in a ZnO Nanowire Field Effect Transistor.

Authors:  Jongwon Yoon; Fu Huang; Ki Hoon Shin; Jung Inn Sohn; Woong-Ki Hong
Journal:  Materials (Basel)       Date:  2020-01-07       Impact factor: 3.623

3.  Scattering Intensity and Directionality Probed Along Individual Zinc Oxide Nanorods with Precisely Controlled Light Polarization and Nanorod Orientation.

Authors:  Daniel S Choi; Manpreet Singh; Sheng Song; Jae Young Chang; Yongkoo Kang; Jong-In Hahm
Journal:  Photonics       Date:  2015-06-18
  3 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.