| Literature DB >> 22588602 |
Jr-Hau He1, Jr-Jian Ke, Pei-Hsin Chang, Kun-Tong Tsai, P C Yang, I-Min Chan.
Abstract
We demonstrated a nanocontacting scheme using a focus ion beam (FIB) system without further heat treatment for ZnO nanowires. This scheme includes Ga ion surface modification and direct-write Pt deposition induced by Ga ion, leading to an Ohmic nanocontact with a specific contact resistance as low as 2.5 × 10(-6)Ω cm(2). Temperature-dependent measurements show that the transport of the FIB-Pt contact on the ZnO nanowire with local surface modification is governed by field emission tunneling. Taking advantage of area-selected and room-temperature processes, Ga ion surface modification and direct-write Pt deposition using a FIB system demonstrates a feasible Ohmic scheme.Entities:
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Year: 2012 PMID: 22588602 DOI: 10.1039/c2nr30688c
Source DB: PubMed Journal: Nanoscale ISSN: 2040-3364 Impact factor: 7.790