| Literature DB >> 22574258 |
Ivan T Lima, Anshul Kalra, Hugo E Hernández-Figueroa, Sherif S Sherif.
Abstract
We show how to efficiently calculate the signal in optical coherence tomography (OCT) systems due to the ballistic photons, the quasi-ballistic photons, and the photons that undergo multiple diffusive scattering using Monte Carlo simulations with importance sampling. This method enables the calculation of these three components of the OCT signal with less than one hundredth of the computational time required by the conventional Monte Carlo method. Therefore, it can be used as a design tool to characterize the performance of OCT systems, and can also be used in the development of novel signal processing techniques that can extend the imaging range of OCT systems. We investigate the parameter dependence of our importance sampling method and we validate it by comparison to an existing method.Entities:
Keywords: (110.4500) Optical coherence tomography; (170.3660) Light propagation in tissues
Year: 2012 PMID: 22574258 PMCID: PMC3345799 DOI: 10.1364/BOE.3.000692
Source DB: PubMed Journal: Biomed Opt Express ISSN: 2156-7085 Impact factor: 3.732
Fig. 1Schematic representation of a simulation setup similar to [5].
Fig. 2The Class I reflectance, shown with thick solid black curve, and the Class II reflectance, shown with thin solid red curve, as a function of the depth for the importance sampling implementation described in Sec. 2 with 108 samples. The pink short dashed curve and the blue long dashed curve are results of 1011 standard Monte Carlo simulations of the Class I reflectance and the Class II reflectance, respectively.
Fig. 3The reflectance results shown in Fig. 2 for the depth interval from 640 µm to 680 µm. The error bars shown for every other point were estimated in the same ensemble of simulations.
Fig. 4The relative error in the calculation of the reflectance using importance sampling as a function of the bias coefficient a at 400 µm and at 670 µm of depth for p = 0.5.
Fig. 5The relative error in the calculation of the reflectance using importance sampling as a function of the probability of additional bias p at 400 µm and at 670 µm of depth for a = 0.9.