| Literature DB >> 22570763 |
Min Wu, Yunfeng Liang, Jian-Zhong Jiang, John S Tse.
Abstract
The O K-edge x-ray Raman scattering (XRS), Brillouin scattering and diffraction studies on silica glass at high pressure have been elucidated in a unified manner using model structures obtained from First-Principles molecular dynamics calculations. This study provides a comprehensive understanding on how the structure is related to the physical and electronic properties. The origin of the "two peak" pattern in the XRS is found to be the result of increased packing of oxygen near the Si and is not a specific sign for sixfold coordination. The compression mechanism involving the presence of 5- and 6-fold coordinated silicon is confirmed. A slight increase in the silicon-oxygen coordination higher than six was found to accompany the increase in the acoustic wave velocity near 140 GPa.Entities:
Year: 2012 PMID: 22570763 PMCID: PMC3347315 DOI: 10.1038/srep00398
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1(a) Comparison of calculated densities as a function of pressure using different models (run A-E, see supplementary material) with experimental data. (b) Comparison of experimental89 and theoretical structure factors (red) of silica glass (black) at selected pressures. Note that the “spikes” in the calculated structure factor are due to the limited size of the simulation cell.
Figure 2Comparison of calculated (color) and experimental (black) x-ray absorption spectra at selected pressure.
Figure 3Calculated (a) projected density of states of Si and O for α-quartz and (b) stishovite with a O 1s core hole. (c) Projected density of states for Si in amorphous silica at high pressure. The zero energy is reference to the minimum of the conduction band.
Figure 4Calculated (a) distribution of Si coordination number; (b) nearest neighbor Si-O distance and (c) average velocity of sound for silica glass as a function of pressure.