Literature DB >> 22552162

Local electrode atom probe analysis of silicon nanowires grown with an aluminum catalyst.

Chad M Eichfeld1, Stephan S A Gerstl, Ty Prosa, Yue Ke, Joan M Redwing, Suzanne E Mohney.   

Abstract

Local electrode atom probe (LEAP) tomography of Al-catalyzed silicon nanowires synthesized by the vapor–liquid–solid method is presented. The concentration of Al within the Al-catalyzed nanowire was found to be 2 × 10(20) cm(-3), which is higher than the expected solubility limit for Al in Si at the nanowire growth temperature of 550°C. Reconstructions of the Al contained within the nanowire indicate a denuded region adjacent to the Al catalyst/Si nanowire interface, while Al clusters are distributed throughout the rest of the silicon nanowire.

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Year:  2012        PMID: 22552162     DOI: 10.1088/0957-4484/23/21/215205

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  2 in total

1.  Growth of epitaxial silicon nanowires on a Si substrate by a metal-catalyst-free process.

Authors:  Takeshi Ishiyama; Shuhei Nakagawa; Toshiki Wakamatsu
Journal:  Sci Rep       Date:  2016-07-28       Impact factor: 4.379

2.  Single-Wedge Lift-Out for Atom Probe Tomography Al/Ni Multilayers Specimen Preparation Based on Dual-Beam-FIB.

Authors:  Yi Qiao; Yalong Zhao; Zheng Zhang; Binbin Liu; Fusheng Li; Huan Tong; Jintong Wu; Zhanqi Zhou; Zongwei Xu; Yue Zhang
Journal:  Micromachines (Basel)       Date:  2021-12-27       Impact factor: 2.891

  2 in total

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