| Literature DB >> 22472757 |
Yves Delacrétaz1, Olivier Seydoux, Stéphane Chamot, Andreas Ettemeyer, Christian Depeursinge.
Abstract
A novel approach for the simulation of the field back-scattered from a rough surface is presented. It takes into account polarization and multiple scattering events on the surface, as well as diffraction effects. The validity and usefulness of this simulation is demonstrated in the case of surface topology measurement.Year: 2012 PMID： 22472757 DOI： 10.1364/JOSAA.29.000270
Source DB: PubMed Journal: J Opt Soc Am A Opt Image Sci Vis ISSN： 1084-7529 Impact factor: 2.129