| Literature DB >> 22424206 |
Hsin Chu Chen1, Kuo Ju Chen, Chao Hsun Wang, Chien Chung Lin, Chia Chi Yeh, Hsin Han Tsai, Min Hsiung Shih, Hao Chung Kuo, Tien Chang Lu.
Abstract
We have successfully demonstrated the enhanced luminous flux and lumen efficiency in white light-emitting diodes by the randomly textured phosphor structure. The textured phosphor structure was fabricated by a simple imprinting technique, which does not need an expensive dry-etching machine or a complex patterned definition. The textured phosphor structure increases luminous flux by 5.4% and 2.5% at a driving current of 120 mA, compared with the flat phosphor and half-spherical lens structures, respectively. The increment was due to the scattering of textured surface and also the phosphor particles, leading to the enhancement of utilization efficiency of blue light. Furthermore, the textured phosphor structure has a larger view angle at the full width at half maximum (87°) than the reference LEDs.Entities:
Year: 2012 PMID: 22424206 PMCID: PMC3315428 DOI: 10.1186/1556-276X-7-188
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Figure 1Process flow charts of flat phosphor. (a) without half-spherical lens (b) with half-spherical lens, and (c) textured phosphor of packages.
Figure 2SEM and AFM measurements. (a) SEM image of randomly textured c-Si mold pattern and (b) AFM image of the textured phosphor structure.
Figure 3Wavelength-dependent haze intensity and angular-dependent relative intensity measurements. (a) The measured wavelength-dependent haze intensity with phosphor in flat/textured silicone structures; the inset is the flat/textured silicone structures without phosphor, and (b) measured angular-dependent relative intensity of the flat and textured phosphor structures at a driving current of 120 mA.
Figure 4Lumen efficiency and luminous flux results. Current-dependent lumen efficiency and luminous flux of flat phosphor, half-spherical lens phosphor, and textured phosphor structures.
Figure 5Far-field emission measurement. Measurement of far-field emission pattern of flat phosphor, half-spherical lens phosphor, and textured phosphor structures.