Literature DB >> 22422978

Scaling hetero-epitaxy from layers to three-dimensional crystals.

Claudiu V Falub1, Hans von Känel, Fabio Isa, Roberto Bergamaschini, Anna Marzegalli, Daniel Chrastina, Giovanni Isella, Elisabeth Müller, Philippe Niedermann, Leo Miglio.   

Abstract

Quantum structures made from epitaxial semiconductor layers have revolutionized our understanding of low-dimensional systems and are used for ultrafast transistors, semiconductor lasers, and detectors. Strain induced by different lattice parameters and thermal properties offers additional degrees of freedom for tailoring materials, but often at the expense of dislocation generation, wafer bowing, and cracks. We eliminated these drawbacks by fast, low-temperature epitaxial growth of Ge and SiGe crystals onto micrometer-scale tall pillars etched into Si(001) substrates. Faceted crystals were shown to be strain- and defect-free by x-ray diffraction, electron microscopy, and defect etching. They formed space-filling arrays up to tens of micrometers in height by a mechanism of self-limited lateral growth. The mechanism is explained by reduced surface diffusion and flux shielding by nearest-neighbor crystals.

Entities:  

Year:  2012        PMID: 22422978     DOI: 10.1126/science.1217666

Source DB:  PubMed          Journal:  Science        ISSN: 0036-8075            Impact factor:   47.728


  9 in total

1.  Electronic Raman scattering as an ultra-sensitive probe of strain effects in semiconductors.

Authors:  Brian Fluegel; Aleksej V Mialitsin; Daniel A Beaton; John L Reno; Angelo Mascarenhas
Journal:  Nat Commun       Date:  2015-05-28       Impact factor: 14.919

2.  Perfect crystals grown from imperfect interfaces.

Authors:  Claudiu V Falub; Mojmír Meduňa; Daniel Chrastina; Fabio Isa; Anna Marzegalli; Thomas Kreiliger; Alfonso G Taboada; Giovanni Isella; Leo Miglio; Alex Dommann; Hans von Känel
Journal:  Sci Rep       Date:  2013       Impact factor: 4.379

3.  Evolution and Engineering of Precisely Controlled Ge Nanostructures on Scalable Array of Ordered Si Nano-pillars.

Authors:  Shuguang Wang; Tong Zhou; Dehui Li; Zhenyang Zhong
Journal:  Sci Rep       Date:  2016-06-29       Impact factor: 4.379

4.  New strategies for producing defect free SiGe strained nanolayers.

Authors:  Thomas David; Jean-Noël Aqua; Kailang Liu; Luc Favre; Antoine Ronda; Marco Abbarchi; Jean-Benoit Claude; Isabelle Berbezier
Journal:  Sci Rep       Date:  2018-02-13       Impact factor: 4.379

5.  Equilibrium crystal shape of GaAs and InAs considering surface vibration and new (111)B reconstruction: ab-initio thermodynamics.

Authors:  In Won Yeu; Gyuseung Han; Jaehong Park; Cheol Seong Hwang; Jung-Hae Choi
Journal:  Sci Rep       Date:  2019-02-04       Impact factor: 4.379

6.  Self-Assembly of Nanovoids in Si Microcrystals Epitaxially Grown on Deeply Patterned Substrates.

Authors:  Andrea Barzaghi; Saleh Firoozabadi; Marco Salvalaglio; Roberto Bergamaschini; Andrea Ballabio; Andreas Beyer; Marco Albani; Joao Valente; Axel Voigt; Douglas J Paul; Leo Miglio; Francesco Montalenti; Kerstin Volz; Giovanni Isella
Journal:  Cryst Growth Des       Date:  2020-04-08       Impact factor: 4.076

7.  The Radon transform as a tool for 3D reciprocal-space mapping of epitaxial microcrystals.

Authors:  Mojmír Meduňa; Fabio Isa; Franco Bressan; Hans von Känel
Journal:  J Appl Crystallogr       Date:  2022-07-05       Impact factor: 4.868

8.  Uprooting defects to enable high-performance III-V optoelectronic devices on silicon.

Authors:  Youcef A Bioud; Abderraouf Boucherif; Maksym Myronov; Ali Soltani; Gilles Patriarche; Nadi Braidy; Mourad Jellite; Dominique Drouin; Richard Arès
Journal:  Nat Commun       Date:  2019-09-20       Impact factor: 14.919

9.  Growth and Coalescence of 3C-SiC on Si(111) Micro-Pillars by a Phase-Field Approach.

Authors:  Marco Masullo; Roberto Bergamaschini; Marco Albani; Thomas Kreiliger; Marco Mauceri; Danilo Crippa; Francesco La Via; Francesco Montalenti; Hans von Känel; Leo Miglio
Journal:  Materials (Basel)       Date:  2019-10-01       Impact factor: 3.623

  9 in total

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