| Literature DB >> 22419367 |
Haibo Dong1, Xiaoxian Zhang, Duan Zhao, Zhiqiang Niu, Qingsheng Zeng, Jinzhu Li, Le Cai, Yanchun Wang, Weiya Zhou, Min Gao, Sishen Xie.
Abstract
The resistive switching behavior of metal-oxide-metal nanoscale devices is a fascinating phenomenon of next generation nonvolatile memories. Here, we demonstrate nanoscale memristive devices based on Zn(2)SnO(4) nanowires (ZTO NWs) for the first time. The devices show high performance bipolar resistive switching behaviors, including an ultrafast response speed of 20 ns, a low operation voltage of <2 V and long data retention (over 5 months). A physical model of metal filament formation along the ZTO NWs has been suggested to explain the bipolar resistive switching behavior.Entities:
Year: 2012 PMID: 22419367 DOI: 10.1039/c2nr30133d
Source DB: PubMed Journal: Nanoscale ISSN: 2040-3364 Impact factor: 7.790