Literature DB >> 22412637

1-Iodo-4-meth-oxy-2-nitro-benzene.

James L Wardell, Edward R T Tiekink.   

Abstract

In the title compound, C(7)H(6)INO(3), the 12 non-H atoms are planar, with an r.m.s. deviation of 0.016 Å. A close intra-molecular I⋯O inter-action [3.0295 (13) Å] is present. Inter-molecular I⋯O inter-actions [3.3448 (13) Å] lead to the formation of zigzag chains along the b axis. These are assembled into layers by weak π-π inter-actions [centroid-centroid distance = 3.8416 (9) Å], and the layers stack along the a axis, being connected by C-H⋯O contacts.

Entities:  

Year:  2012        PMID: 22412637      PMCID: PMC3295526          DOI: 10.1107/S1600536812006484

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For general background to halogen bonding, see: Metrangolo et al. (2008 ▶); Pennington et al. (2008 ▶). For previous structural studies probing iodo–nitro inter­actions, see: Glidewell et al. (2002 ▶, 2004 ▶); Garden et al. (2002 ▶). For van der Waals radii, see: Bondi (1964 ▶).

Experimental

Crystal data

C7H6INO3 M = 279.03 Orthorhombic, a = 18.6370 (13) Å b = 11.6257 (5) Å c = 7.4740 (3) Å V = 1619.38 (15) Å3 Z = 8 Mo Kα radiation μ = 3.92 mm−1 T = 100 K 0.13 × 0.09 × 0.01 mm

Data collection

Rigaku Saturn724+ (2 × 2 bin mode) diffractometer Absorption correction: multi-scan (CrystalClear-SM Expert; Rigaku, 2011 ▶) T min = 0.755, T max = 1.000 8053 measured reflections 1841 independent reflections 1615 reflections with I > 2σ(I) R int = 0.017

Refinement

R[F 2 > 2σ(F 2)] = 0.014 wR(F 2) = 0.039 S = 1.04 1841 reflections 110 parameters H-atom parameters constrained Δρmax = 0.42 e Å−3 Δρmin = −0.25 e Å−3 Data collection: CrystalClear-SM Expert (Rigaku, 2011 ▶); cell refinement: CrystalClear-SM Expert; data reduction: CrystalClear-SM Expert; program(s) used to solve structure: SHELXS97 (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008 ▶); molecular graphics: ORTEP-3 (Farrugia, 1997 ▶) and DIAMOND (Brandenburg, 2006 ▶); software used to prepare material for publication: publCIF (Westrip, 2010 ▶). Crystal structure: contains datablock(s) global, I. DOI: 10.1107/S1600536812006484/hg5176sup1.cif Structure factors: contains datablock(s) I. DOI: 10.1107/S1600536812006484/hg5176Isup2.hkl Supplementary material file. DOI: 10.1107/S1600536812006484/hg5176Isup3.cml Additional supplementary materials: crystallographic information; 3D view; checkCIF report
C7H6INO3F(000) = 1056
Mr = 279.03Dx = 2.289 Mg m3
Orthorhombic, PbcaMo Kα radiation, λ = 0.71073 Å
Hall symbol: -P 2ac 2abCell parameters from 6840 reflections
a = 18.6370 (13) Åθ = 3.4–27.4°
b = 11.6257 (5) ŵ = 3.92 mm1
c = 7.4740 (3) ÅT = 100 K
V = 1619.38 (15) Å3Plate, dark-orange
Z = 80.13 × 0.09 × 0.01 mm
Rigaku Saturn724+ (2x2 bin mode) diffractometer1841 independent reflections
Radiation source: Rotating Anode1615 reflections with I > 2σ(I)
Confocal monochromatorRint = 0.017
Detector resolution: 28.5714 pixels mm-1θmax = 27.5°, θmin = 3.4°
profile data from ω–scansh = −15→24
Absorption correction: multi-scan (CrystalClear-SM Expert; Rigaku, 2011)k = −14→14
Tmin = 0.755, Tmax = 1.000l = −9→8
8053 measured reflections
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.014Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.039H-atom parameters constrained
S = 1.04w = 1/[σ2(Fo2) + (0.0188P)2 + 0.9351P] where P = (Fo2 + 2Fc2)/3
1841 reflections(Δ/σ)max = 0.002
110 parametersΔρmax = 0.42 e Å3
0 restraintsΔρmin = −0.25 e Å3
Geometry. All s.u.'s (except the s.u. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell s.u.'s are taken into account individually in the estimation of s.u.'s in distances, angles and torsion angles; correlations between s.u.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell s.u.'s is used for estimating s.u.'s involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > 2σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.
xyzUiso*/Ueq
I10.697282 (5)0.925416 (9)−0.003362 (13)0.01546 (5)
O10.70514 (6)0.66598 (11)−0.03589 (18)0.0231 (3)
O20.62939 (7)0.52986 (10)0.01236 (15)0.0214 (3)
O30.41118 (6)0.68759 (8)0.23820 (15)0.0148 (2)
N10.64607 (7)0.63180 (12)0.01188 (16)0.0133 (3)
C10.60441 (8)0.83551 (12)0.0734 (2)0.0119 (3)
C20.59202 (8)0.71660 (12)0.0719 (2)0.0116 (3)
C30.52698 (8)0.67047 (12)0.12652 (19)0.0122 (3)
H30.51990.58960.12360.015*
C40.47214 (8)0.74173 (12)0.1854 (2)0.0115 (3)
C50.48273 (8)0.86045 (12)0.1870 (2)0.0128 (3)
H50.44550.91040.22540.015*
C60.54812 (8)0.90498 (12)0.1319 (2)0.0131 (3)
H60.55480.98600.13420.016*
C70.35196 (8)0.75849 (13)0.2943 (2)0.0157 (3)
H7A0.36580.80250.40070.024*
H7B0.31070.70960.32280.024*
H7C0.33910.81160.19770.024*
U11U22U33U12U13U23
I10.01244 (8)0.01476 (8)0.01918 (8)−0.00280 (4)0.00198 (3)0.00187 (4)
O10.0129 (6)0.0209 (6)0.0354 (7)0.0015 (5)0.0054 (5)−0.0037 (5)
O20.0223 (7)0.0104 (5)0.0315 (7)0.0033 (5)0.0035 (5)−0.0004 (4)
O30.0109 (5)0.0121 (5)0.0214 (6)−0.0013 (4)0.0029 (4)−0.0001 (4)
N10.0128 (6)0.0149 (6)0.0124 (6)0.0025 (5)−0.0020 (4)−0.0002 (5)
C10.0108 (7)0.0137 (7)0.0113 (7)−0.0019 (6)−0.0011 (5)0.0018 (5)
C20.0122 (7)0.0115 (6)0.0111 (7)0.0038 (6)−0.0016 (5)−0.0007 (5)
C30.0146 (7)0.0091 (6)0.0130 (7)0.0003 (5)−0.0024 (5)0.0004 (5)
C40.0101 (6)0.0135 (7)0.0109 (7)−0.0013 (5)−0.0014 (5)0.0007 (5)
C50.0116 (7)0.0121 (6)0.0148 (7)0.0027 (6)−0.0009 (5)−0.0010 (5)
C60.0154 (7)0.0097 (6)0.0143 (7)−0.0006 (6)−0.0014 (6)0.0003 (6)
C70.0110 (7)0.0170 (7)0.0191 (8)0.0009 (6)0.0019 (6)0.0001 (6)
I1—C12.1017 (14)C3—C41.387 (2)
O1—N11.2238 (18)C3—H30.9500
O2—N11.225 (2)C4—C51.394 (2)
O3—C41.3574 (18)C5—C61.386 (2)
O3—C71.4398 (18)C5—H50.9500
N1—C21.4791 (19)C6—H60.9500
C1—C61.395 (2)C7—H7A0.9800
C1—C21.4017 (19)C7—H7B0.9800
C2—C31.387 (2)C7—H7C0.9800
C4—O3—C7117.44 (11)O3—C4—C5125.10 (13)
O1—N1—O2122.90 (14)C3—C4—C5119.30 (13)
O1—N1—C2119.00 (13)C6—C5—C4119.44 (13)
O2—N1—C2118.10 (13)C6—C5—H5120.3
C6—C1—C2116.72 (13)C4—C5—H5120.3
C6—C1—I1114.66 (10)C5—C6—C1122.56 (13)
C2—C1—I1128.62 (11)C5—C6—H6118.7
C3—C2—C1121.54 (13)C1—C6—H6118.7
C3—C2—N1115.27 (12)O3—C7—H7A109.5
C1—C2—N1123.19 (13)O3—C7—H7B109.5
C2—C3—C4120.42 (13)H7A—C7—H7B109.5
C2—C3—H3119.8O3—C7—H7C109.5
C4—C3—H3119.8H7A—C7—H7C109.5
O3—C4—C3115.59 (12)H7B—C7—H7C109.5
C6—C1—C2—C3−0.2 (2)C7—O3—C4—C3−177.84 (13)
I1—C1—C2—C3−179.68 (11)C7—O3—C4—C52.3 (2)
C6—C1—C2—N1179.41 (13)C2—C3—C4—O3−179.07 (13)
I1—C1—C2—N1−0.1 (2)C2—C3—C4—C50.8 (2)
O1—N1—C2—C3−178.97 (13)O3—C4—C5—C6179.05 (14)
O2—N1—C2—C31.04 (19)C3—C4—C5—C6−0.9 (2)
O1—N1—C2—C11.5 (2)C4—C5—C6—C10.4 (2)
O2—N1—C2—C1−178.54 (14)C2—C1—C6—C50.1 (2)
C1—C2—C3—C4−0.3 (2)I1—C1—C6—C5179.73 (12)
N1—C2—C3—C4−179.93 (13)
D—H···AD—HH···AD···AD—H···A
C7—H7B···O1i0.982.583.4503 (19)148
Table 1

Hydrogen-bond geometry (Å, °)

D—H⋯AD—HH⋯ADAD—H⋯A
C7—H7B⋯O1i0.982.583.4503 (19)148

Symmetry code: (i) .

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2.  Isomeric iodo-N-(nitrobenzyl)anilines: interplay of hard and soft hydrogen bonds, iodo...nitro interactions and aromatic pi...pi stacking interactions.

Authors:  Christopher Glidewell; John N Low; Janet M S Skakle; Solange M S V Wardell; James L Wardell
Journal:  Acta Crystallogr B       Date:  2004-07-19

3.  Interplay of hydrogen bonds, iodo...nitro interactions and aromatic pi...pi stacking interactions in iodo-nitroanilines.

Authors:  Simon J Garden; Silvia P Fontes; James L Wardell; Janet M S Skakle; John N Low; Christopher Glidewell
Journal:  Acta Crystallogr B       Date:  2002-07-30

4.  Nine isomeric nitrobenzylidene-iodoanilines: interplay of C-H...O hydrogen bonds, iodo...nitro interactions and aromatic pi...pi stacking interactions.

Authors:  Christopher Glidewell; R Alan Howie; John N Low; Janet M S Skakle; Solange M S V Wardell; James L Wardell
Journal:  Acta Crystallogr B       Date:  2002-09-24
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