| Literature DB >> 22401350 |
I-Shun Wang1, Yi-Ting Lin, Chi-Hsien Huang, Tseng-Fu Lu, Cheng-En Lue, Polung Yang, Dorota G Pijanswska, Chia-Ming Yang, Jer-Chyi Wang, Jau-Song Yu, Yu-Sun Chang, Chien Chou, Chao-Sung Lai.
Abstract
Thin hafnium oxide layers deposited by an atomic layer deposition system were investigated as the sensing membrane of the electrolyte-insulator-semiconductor structure. Moreover, a post-remote NH3 plasma treatment was proposed to replace the complicated silanization procedure for enzyme immobilization. Compared to conventional methods using chemical procedures, remote NH3 plasma treatment reduces the processing steps and time. The results exhibited that urea and antigen can be successfully detected, which indicated that the immobilization process is correct.Entities:
Year: 2012 PMID: 22401350 PMCID: PMC3329401 DOI: 10.1186/1556-276X-7-179
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Figure 1Schematics of NH. (a) NH2 molecular formed after plasma treatment. (b) Covalent bonding process flow of ALD-HfO2-EIS based on sensing membrane.
Figure 2pH Sensitivity and linearity characteristics and normalized C-V curves. (a) pH sensitivity and linearity characteristics of the ALD-HfO2-EIS devices with various HfO2 thicknesses. (b) Normalized C-V curves for the ALD-HfO2 and 3.5-nm-thick ALD-HfO2-EIS structure measured at pH 2 to pH 12.
Figure 3The urea detection of ALD-HfO.
Figure 4The BSA detection response of ALD-HfO. (a) Without any treatment, (b) with chemical silanization treatment, and (c) with NH3 plasma treatment.