| Literature DB >> 22401200 |
N Camus1, B Fischer, M Kremer, V Sharma, A Rudenko, B Bergues, M Kübel, N G Johnson, M F Kling, T Pfeifer, J Ullrich, R Moshammer.
Abstract
The strong-field induced decay of a doubly excited, transient Coulomb complex Ar**→Ar(2+)+2e(-) is explored by tracing correlated two-electron emission in nonsequential double ionization of Ar as a function of the carrier-envelope phase. Using <6 fs pulses, electron emission is essentially confined to one optical cycle. Classical model calculations support that the intermediate Coulomb complex has lost memory of its formation dynamics and allows for a consistent, though model-dependent definition of "emission time," empowering us to trace transition-state two-electron decay dynamics with sub-fs resolution. We find a most likely emission time difference of ∼200±100 as.Year: 2012 PMID: 22401200 DOI: 10.1103/PhysRevLett.108.073003
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161